Large Chip Availability

[Ralph.Holtom at eev.com]

Large Chip Availability

As I am sure you all know, EEV are one of the very few companies in the 
world capable of manufacturing large area back illuminated CCDs optimised 
for use in astronomy.  We are currently very busy manufacturing such devices 
for a number of telescope projects and in the course of these programmes we 
are inevitably generating a number of lower specification devices which are 
not satisfactory for our prime customers but nonetheless are capable of 
doing very good work in programmes with different requirements.  We are 
willing and able to sell these devices and to help you decide whether these 
chips could be of interest, you will find below a table listing serial 
numbers and the primary characteristics of each device.  You will see that 
we are really only listing cosmetic characteristics since in most other 
respects these devices are within specification.  (This table is also shown 
in the attachment to this message for those who can read it successfully). 
 These chips are available on short notice, typically four weeks.

The devices listed are CCD42-80 which is our 2K x 4K 13.5µm pixel, back 
illuminated CCD and CCD42-40 which is the 2k x 4k 13.5 micron pixel variant. 
 I attach to this e-mail the short form data sheet for the CCD42-80 device, 
in both Wordperfect and Word  6 format.  A full data sheet can be faxed to 
you upon request.

Later on we will probably make a similar offer of CCD42-90 devices which are 
2K x 4.5K13½micron pixel device and possibly other Large Area devices.  If 
any of you are interested in buying any of these devices please contact me 
mentioning the serial numbers that you are interested in so that we can 
start discussions.

Serial No B Cols         W Cols         B Spots        W 
Spots          Comments

CCD42-80 (BI)

7042-16-3 13        0         231       99        
7042-3-4       22        0         460       148       
7042-7-5       5         15        ?         >2000          
7043-18-5 70        2         ?         ?         
7042-18-4 0         6         ?         53        
7061-20-4 13        0         ?         38        
7043-14-5 24        8         ?         ?         
7043-5-5       0         5         ?         700       
7043-4-5       2         6         ?         1000      
7043-16-3 0         7         5000      190       
7043-16-5 15        0         792       141       
7061-5-5       25        0         ?         169       
7043-10-5 ?         150       ?         ?         
7043-15-4 ?         7         ?         1250 

CCD42-40 (BI)

7041-2-4       0         1         124       189
7041-2-6       0         1         188       628
7041-2-8       2         3         ?         ?    1 amplifier only
6471-5-7       1         5         365       78

CCD42-40 (FI)

6471-3-5       ?         ?         ?              
6471-3-6       ?         2         ?         276
6471-2-8       1         0         ?         0
6471-10-3 ?         1         ?         195

We show a ? where the number of columns excluded the device from our 
customers specification  so we did not carry out a count of blemishes.  In 
general the number will be less than 1000 however if anyone shows interest 
in this particular device we will count the blemishes for them.

SUG            =    Set-up Grade

Blemish Specification

Black Spots         =    Are counted when they have a responsivity of less 
than 80% of the local mean signal.

White Spots         =    Are counted when they have a generation rate 
equivalent to 100 electrons per pixel per hour at 153 K (typically measured 
at 188 K).  The typical temperature dependence of white spot blemishes is 
the same as that of the average dark signal i.e.:

                              Qd/Qdo = 122T³e -6400 /T

Column Defects =    A column which contains at least 100 white or black 
defects.




Ralph Holtom
rh at eev.com

[[ 42803.DOC : 3932 in 42803.DOC ]][[ 4280904.WPD : 3933 in 4280904.WPD ]][[ 
TABLE.WPD : 3934 in TABLE.WPD ]]
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