From smithk at routes.com  Thu Apr 29 09:58:22 1999
From: smithk at routes.com (Ken Smith)
Date: Thu Jul 29 11:54:45 2004
Subject: CCD on-chip gain vs temperature
References: <0D3B8ACF7565D211A36500A0C9E91F8007BE48@154-111.egginc.com>
Message-ID: <3728657E.816A2C91@routes.com>

Posted to CCD-world:
-+-+-+-
Dear CCD-World:

I am looking for any information or indication if CCD on-chip gain (electrons to
volt conversion factor) changes with temperature.  I thought I would ask here first
before doing any tests myself.  It the gain can change with temperature, presumably
it would be due to any temperature sensitivity of the output node capacitance.
Also, is there any mechanism that would cause the QE to change with temperature ?


Thanks,

Ken Smith
Routes Inc
Canada


-+-+-+-
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From Peter.Pool at eev.com  Wed Apr 28 09:04:36 1999
From: Peter.Pool at eev.com (Peter.Pool@eev.com)
Date: Thu Jul 29 11:54:45 2004
Subject: EUV CCD
Message-ID: <TFSHGTUI@eev.com>

Posted to CCD-world:
-+-+-+-
Hi
     Short summary:

1.  Thin passivating layer
2.  Clean vacuum system (many measurements are degraded by absorption in 
adsorbed layers)

Peter Pool

 ----------
From: jmdefise@ulg.ac.be
To: ccd-world@cfht.hawaii.edu
Subject: EUV CCD
Date: 27 April 1999 14:42

<<File Attachment: ENVELOPE.TXT>>
Posted to CCD-world:
 -+-+-+-
Hi CCD-World,

Is it possible to shortly summarize the features (and their resulting
effects) that can be used to improve the EUV sensitivity of CCD's? I mean
for wavelengths ranging from 15 to 40 nm.


Many thanks,


Jean Marc DEFISE


CENTRE SPATIAL DE LIEGE
Avenue du Pre Aily B-4031 Angleur BELGIUM
www.ulg.ac.be/cslulg
jmdefise@ulg.ac.be
===========================================

 -+-+-+-
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owner-CCD-world@cfht.hawaii.edu.


-+-+-+-
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From Venkat_Iyer at Reticon.egginc.com  Tue Apr 27 09:53:16 1999
From: Venkat_Iyer at Reticon.egginc.com (Iyer, Venkat)
Date: Thu Jul 29 11:54:45 2004
Subject: Help with array detector terminology.
Message-ID: <0D3B8ACF7565D211A36500A0C9E91F8007BE49@154-111.egginc.com>

Posted to CCD-world:
-+-+-+-
CCD array - uses a CCD for light detection
Photodiode array - uses a diode for light detection
CCD photodiode array - uses a diode for light detection and an adjacent
CCD structure to read 				it out
Pinned photodiode - Fixes the potential of the diode with reference to
the surface to have 	better control of the potential well of the
diode.  This helps with image lag. I

Hope this helps.

Venkat Iyer (Sr. Design Engineer)
EG&G Optoelectronics
345 Potrero Ave
Sunnyvale, CA-94086
(408)38-4266 x263      fax:(408)738-3832



QUESTION of the day:

Could someone explain (or point me to pertinent literature) 
the difference between a pinned photodiode array, a charge
coupled photodiode array, and a CCD array?  I thought I had
this worked out (somewhat), but now I am not so sure.

Any help would be appreciated.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS
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From Venkat_Iyer at Reticon.egginc.com  Tue Apr 27 09:35:36 1999
From: Venkat_Iyer at Reticon.egginc.com (Iyer, Venkat)
Date: Thu Jul 29 11:54:45 2004
Subject: Another array term from EG&G.
Message-ID: <0D3B8ACF7565D211A36500A0C9E91F8007BE48@154-111.egginc.com>

Posted to CCD-world:
-+-+-+-
The photodiode linear array uses a diode structure to collect charge and
an adjacent CCD 
structure to move it out to the horizontal register for readout.
Advantages are realization of UV QE down to 200 nm as there are no gates
on the diode blocking light.  The charge collects in the diode and
spills over into the adjacent gate structure.

Venkat Iyer (Sr. Design Engineer)
EG&G Optoelectronics
345 Potrero Ave
Sunnyvale, CA-94086
(408)38-4266 x263      fax:(408)738-3832

-----Original Message-----
From: Sutherland, Scott [mailto:ssutherl@gammametrics.com]
Sent: Monday, April 26, 1999 12:54 PM
To: 'CCD-world@cfht.hawaii.edu'
Subject: Another array term from EG&G.


Posted to CCD-world:
-+-+-+-
I have found another 'version' of array that EG&G
offers, referred to as a Monolithic photodiode.

I add this to my list of 'confusion' for types of array
detectors.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS

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From jmdefise at ulg.ac.be  Tue Apr 27 14:22:54 1999
From: jmdefise at ulg.ac.be (Jean Marc DEFISE)
Date: Thu Jul 29 11:54:45 2004
Subject: EUV CCD
Message-ID: <00a901be90a8$ad245ee0$ebb2a58b@soho.csl.ulg.ac.be>

Posted to CCD-world:
-+-+-+-
Hi CCD-World,

Is it possible to shortly summarize the features (and their resulting
effects) that can be used to improve the EUV sensitivity of CCD's? I mean
for wavelengths ranging from 15 to 40 nm.


Many thanks,


Jean Marc DEFISE


CENTRE SPATIAL DE LIEGE
Avenue du Pre Aily B-4031 Angleur BELGIUM
www.ulg.ac.be/cslulg
jmdefise@ulg.ac.be
===========================================

-+-+-+-
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From RACHEL_GRUNEISEN at SODERN.fr  Tue Apr 27 13:39:49 1999
From: RACHEL_GRUNEISEN at SODERN.fr (GRUNEISEN R.)
Date: Thu Jul 29 11:54:45 2004
Subject: EEV CCD antiblooming efficiency
Message-ID: <EB4453D77AC5D21187BD0000F831173CD8C9@STARGATE>

Posted to CCD-world:
-+-+-+-
What is the antiblooming  efficiency [e-/pixel/clocking cycle] that can be
reached with an EEV CCD, at a given temperature? Has anybody informations of
that kind?

Thanks a lot,
Rachel Gruneisen,
SODERN

-+-+-+-
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From ssutherl at gammametrics.com  Mon Apr 26 12:54:08 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:45 2004
Subject: Another array term from EG&G.
Message-ID: <1583828ED67FD211A31D006008277B19012F2B@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
I have found another 'version' of array that EG&G
offers, referred to as a Monolithic photodiode.

I add this to my list of 'confusion' for types of array
detectors.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS

-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From ssutherl at gammametrics.com  Mon Apr 26 12:40:05 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:45 2004
Subject: Help with array detector terminology.
Message-ID: <1583828ED67FD211A31D006008277B19012F2A@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
Hello all:

Last week I posted a request for information on finding a
substitute array detector for a SONY ILX511.  In one 
reply I was forwarded to EG&G Reticon's web site.  I had
looked at these detectors in the past, but not recently.

In looking at the specs, I see some terminology that is
somewhat confusing and I was hoping someone could
clarify this.  

Ocean Optics, which uses the SONY ILX511 in their S2000
miniature spectrometer, refers to this detector as a CCD.
StellarNet, which offers this detector and the Toshiba
TCD1201D, refer to the SONY device as a CCD and the
Toshiba as a photodiode array.  They claim the SONY
is more sensitive than the Toshiba, even in the red, because
it is a CCD, even though the Toshiba QE peaks closer
to the red than the SONY (e.g for the 660 nm photodiode
sensitivity spec). The data sheets from Toshiba and SONY
confirm that the SONY is more sensitive than the Toshiba.
I still do not understand this UNLESS the QE of the SONY
at peak is MUCH higher than the QE of the Toshiba.  The
respective data sheets do not provide this data.
I posted a question 2-3 weeks ago on this, hoping
for clarification, but got no response.

I was told that the SONY was, indeed, a photodiode array
with a CCD readout register.  I do not understand this description
versus a 'normal PDA'.  To further complicate things, the Reticon
page has the following differentiation for its P-series line scan sensors:

Pinned Photodiode Arrays
Charge Coupled Photodiode Arrays

QUESTION of the day:

Could someone explain (or point me to pertinent literature) 
the difference between a pinned photodiode array, a charge
coupled photodiode array, and a CCD array?  I thought I had
this worked out (somewhat), but now I am not so sure.

Any help would be appreciated.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From smithk at routes.com  Mon Apr 26 10:36:47 1999
From: smithk at routes.com (Ken Smith)
Date: Thu Jul 29 11:54:45 2004
Subject: TDI CCDs
References: <9D70BF372E81D2119C3900609769B49F02FEE5@server1.sireo.co.uk>
Message-ID: <372479FE.F0C38D3E@routes.com>

Posted to CCD-world:
-+-+-+-


Hopkinson, Gordon wrote:

> I'm interested in finding a TDI CCD for a possible space application.
> Ideally the line length should be about 5,000 pixels and about 10 lines of
> TDI is all we need.
>
> The device needs to be off-the-shelf, so some compromise in pixel format is
> possible.  There are no particular requirements for extended blue or near-IR
> response.


Off-hand, I would say Dalsa (in Canada) is you best bet, as they make a lot of TDI
and large CCDs, but both together might be a challange.  Their web site is at
http://www.dalsa.com

They tend to cater to the industrial imaging market, so you will have to space
qualify them yourself I expect.  My guess is you have an earth observation
application that needs high resolution and also high SNR.


Ken Smith
Electro-optics and electronics
Routes Inc
Canada


-+-+-+-
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From gordon_hopkinson at siraeo.co.uk  Mon Apr 26 13:03:55 1999
From: gordon_hopkinson at siraeo.co.uk (Hopkinson, Gordon)
Date: Thu Jul 29 11:54:45 2004
Subject: TDI CCDs
Message-ID: <9D70BF372E81D2119C3900609769B49F02FEE5@server1.sireo.co.uk>

Posted to CCD-world:
-+-+-+-
Dear CCD world

I'm interested in finding a TDI CCD for a possible space application.
Ideally the line length should be about 5,000 pixels and about 10 lines of
TDI is all we need.

The device needs to be off-the-shelf, so some compromise in pixel format is
possible.  There are no particular requirements for extended blue or near-IR
response.

Best regards

Gordon Hopkinson
Sira Electro-Optics Ltd

-+-+-+-
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From droege at wwa.com  Thu Apr 22 12:17:52 1999
From: droege at wwa.com (Tom Droege)
Date: Thu Jul 29 11:54:45 2004
Subject: Spots
Message-ID: <3.0.32.19990422121750.00ed52c0@miso.wwa.com>

Posted to CCD-world:
-+-+-+-
Hi Roy,

Thank you.  This is a low end Grade 4 device.  It also has a bad column.
So I think it is from the low end of the distribution.  Arne Henden now
says such defects are common.  

I think it will not be too hard to flat field them out.  

I am amused by the advice I get from CCD-world.  "Buy only Top Grade Chips
for Astronomy"...   Sounds to me like advice from Marie Antonette.  ;^)

Things are going well, with the usual disasters.  We will soon have a bunch
of 2k cameras in the field.

Tom 

At 09:54 AM 4/21/99 -0700, you wrote:
>Posted to CCD-world:
>-+-+-+-
>At 01:22 PM 4/20/99 -0500, you wrote:
>>Posted to CCD-world:
>>-+-+-+-
>>The Amateur Sky Survey now has several 2k x 2k CCD cameras running using
>>the CCD442A.  We have bought the Grade 4 (lowest cost) devices.
>>
>>On one of the cameras, I see large round dark spots.  One is a few hundred
>>pixels in diameter.  Others are smaller.  Most of these spots represent
>>lower sensitivity of a few percent.  One has increased sensitivity.  Being
>>the tass list, these have sparked a debate as to their source.  We are
>>running the present CCDs with covers.  (CCDs are now on order without
>>covers.)  In my opinion, the edges of the spots are too sharp to be due to
>>dirt on the cover or in the optics.  The spots are on the only CCD with a
>>bad column, indicating that this is possibly a lower grade overall device.  
>>
>>Can anyone tell me if such spots are common on a CCD?  Flat fielding mostly
>>removes the problem, so this in not all that serious a defect. 
>
>Hi Tom,
>     If these are thinned devices with an anti-reflection coating, these
>spots might be due to a defect in the AR coating. I have a thinned,
>AR-coated device with such an artifact.
>					- Roy Tucker
>
>
>-+-+-+-
>For information about CCD-world, send email to
owner-CCD-world@cfht.hawaii.edu.
>
>
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From or_marshs at integrityonline.com  Thu Apr 22 21:55:43 1999
From: or_marshs at integrityonline.com (The Oregon Marsh's)
Date: Thu Jul 29 11:54:46 2004
Subject: Spots before our silicon eyes
Message-ID: <199904222204.SM00193@compi>

Posted to CCD-world:
-+-+-+-
The CCD in the Star-1 series was a Thomson TH7883A.  Such "shading" defect
areas are 
relatively rare for front CCDs--on thinned devices, chemical spots due to
the thinning process 
and/or AR coating nonuniformities can sometimes produce spots with higher
or lower QE (depending 
on wavelength).  

It is difficult to spec these low-impact defects--if one wants perfect
imagers, they either must negotiate 
with the CCD vendor to assure they don't receive devices with defects they
are sensitive to or just get 
lucky.  With the real estate of CCDs being fairly large (and, the scrutiny
of scientific CCD users being 
so high), guaranteeing perfect CCDs will make them extremely expensive
(either for testing time or 
yield loss).  I've worked on both sides of the fence (CCD vendor and camera
producer), and open 
communication and specification agreement between the two can help make
both satisfied.  However,
it is difficult when sales volumes are low!

	Harry H. Marsh
	PixelVision of Oregon

----------
From: iss@pvtnetworks.net
To: CCD-world@cfht.hawaii.edu
Subject: Re: Spots
Date: Wednesday, April 21, 1999 9:57 AM

Posted to CCD-world:
-+-+-+-
Re,

> > > Can anyone tell me if such spots are common on a CCD?
> >
> > Not at all. I think You should use better CCD grade if possible. We
> > normally use best grade CCD and dont have similar problems.
> >
>I agree; good (or even poor) CCDs don't normally have such features- 
>especially if they are round, and hundreds of pixels across.  The spots 
>sound very much like 'dust rings' caused by out-of-focus dust spots on
cover 
>glass, or fiters etc.  Reasonably sharp-looking annular rings can be
caused 
>by contamination in front of the focal plane.  It depends somewhat on the 
>nature of your illumination.

We had a Star-1A Photometrics CCD at the NASA JSC Star Tracker lab 
a few years ago that had what I believe is a genuine defect of this type,
it was parabolic shaped and covered about 1/4 of the field
of view. It looked like a negative image of a comet and the pixels
in it were about 3-4% less sensitive than the rest of the field.
It was not contamination, several cleanings verified this. After some
'negotiations' with the mfr, they sent us a test image taken with that
particular Phillips CCD chip which showed the identical defect. Their
claim was that if the response uniformity was <5% the chip was acceptable.
Since there was no spec on cluster defects we had to accept it as is; it
did flat field out ok. This was not an 'engineering' or low grade chip.
So, in our experience, defects of the sort noted by Tom are quite
possible and if significant to your application, should be eliminated
by specification and TESTED independently (ie not by the mfr).

Andy Saulietis
Andy Saulietis / ISS Alt-Az-Fp Drive Systems
HDPE Worm Gears, Custom designed mount/telescopes & Machine work
CCD filter wheels & other custom accessories
39 Silver Fox Trail
Cloud Country Estates
Mayhill NM 88339
505-687-3067 Voice
505-687-3021   Fax
e-mail: iss@pvtnetworks.net
32 54 13 N  105 31 44 W 7300' elev

-+-+-+-
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owner-CCD-world@cfht.hawaii.edu.

-+-+-+-
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From droege at wwa.com  Thu Apr 22 12:27:07 1999
From: droege at wwa.com (Tom Droege)
Date: Thu Jul 29 11:54:46 2004
Subject: Spots
Message-ID: <3.0.32.19990422122705.00ed52c0@miso.wwa.com>

Posted to CCD-world:
-+-+-+-
Thanks to all for the advice on spots.  This is not a government financed
operation so we will have to make do with the lowest cost devices we can
find.  Some of you have advised buying higher grade devices.  Ahhh!  Advice
from Marie Antonette.  (A joke, not meant to be harmful - I do appreciate
the help.)

Some may question whether we can do good science with lowest grade devices.
 We shall see.  That is much of what tass is about.  We are trying to put
together a group of amateurs to do a serious bit of science.  

Tom Droege
-+-+-+-
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From bgoodin at unex.ucla.edu  Wed Apr 21 16:14:11 1999
From: bgoodin at unex.ucla.edu (Goodin, Bill)
Date: Thu Jul 29 11:54:46 2004
Subject: UCLA summer short course on CCD/CMOS Imaging Sensors and Applicat
	ions
Message-ID: <0924444DEBC4D111BC9200A0C960C70601400C94@www3.unex.ucla.edu>

Posted to CCD-world:
-+-+-+-

This summer, UCLA Extension will present the following short course 
on the UCLA campus in Los Angeles.

August 30-September 1, 1999, "CCD/CMOS Imaging Sensors and 
Applications".  The instructors are James R. Janesick, MSEE, Executive 
Vice President and Chief Scientific Director, Advanced Systems Division, 
PixelVision; Bedabrata Pain, PhD, Member of the Principal Engineering 
Staff, Jet Propulsion Laboratory, $1195.

For additional information and a complete course description, please
visit our web page, http://www.unex.ucla.edu/shortcourses/,

or contact Marcus Hennessy at:
(310) 825-1047
(310) 206-2815  fax
mhenness@unex.ucla.edu

This course may also be presented on-site at company locations.

-+-+-+-
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From tucker at noao.edu  Wed Apr 21 09:54:12 1999
From: tucker at noao.edu (Roy Tucker)
Date: Thu Jul 29 11:54:46 2004
Subject: Spots
In-Reply-To: <3.0.32.19990420132241.00e88ad8@miso.wwa.com>
Message-ID: <3.0.5.32.19990421095412.00a69720@orion>

Posted to CCD-world:
-+-+-+-
At 01:22 PM 4/20/99 -0500, you wrote:
>Posted to CCD-world:
>-+-+-+-
>The Amateur Sky Survey now has several 2k x 2k CCD cameras running using
>the CCD442A.  We have bought the Grade 4 (lowest cost) devices.
>
>On one of the cameras, I see large round dark spots.  One is a few hundred
>pixels in diameter.  Others are smaller.  Most of these spots represent
>lower sensitivity of a few percent.  One has increased sensitivity.  Being
>the tass list, these have sparked a debate as to their source.  We are
>running the present CCDs with covers.  (CCDs are now on order without
>covers.)  In my opinion, the edges of the spots are too sharp to be due to
>dirt on the cover or in the optics.  The spots are on the only CCD with a
>bad column, indicating that this is possibly a lower grade overall device.  
>
>Can anyone tell me if such spots are common on a CCD?  Flat fielding mostly
>removes the problem, so this in not all that serious a defect. 

Hi Tom,
     If these are thinned devices with an anti-reflection coating, these
spots might be due to a defect in the AR coating. I have a thinned,
AR-coated device with such an artifact.
					- Roy Tucker


-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From iss at pvtnetworks.net  Wed Apr 21 10:57:14 1999
From: iss at pvtnetworks.net (iss@pvtnetworks.net)
Date: Thu Jul 29 11:54:46 2004
Subject: Spots
Message-ID: <199904211657.KAA08146@intergate.pvtnetworks.net>

Posted to CCD-world:
-+-+-+-
Re,

> > > Can anyone tell me if such spots are common on a CCD?
> >
> > Not at all. I think You should use better CCD grade if possible. We
> > normally use best grade CCD and dont have similar problems.
> >
>I agree; good (or even poor) CCDs don't normally have such features- 
>especially if they are round, and hundreds of pixels across.  The spots 
>sound very much like 'dust rings' caused by out-of-focus dust spots on cover 
>glass, or fiters etc.  Reasonably sharp-looking annular rings can be caused 
>by contamination in front of the focal plane.  It depends somewhat on the 
>nature of your illumination.

We had a Star-1A Photometrics CCD at the NASA JSC Star Tracker lab 
a few years ago that had what I believe is a genuine defect of this type,
it was parabolic shaped and covered about 1/4 of the field
of view. It looked like a negative image of a comet and the pixels
in it were about 3-4% less sensitive than the rest of the field.
It was not contamination, several cleanings verified this. After some
'negotiations' with the mfr, they sent us a test image taken with that
particular Phillips CCD chip which showed the identical defect. Their
claim was that if the response uniformity was <5% the chip was acceptable.
Since there was no spec on cluster defects we had to accept it as is; it
did flat field out ok. This was not an 'engineering' or low grade chip.
So, in our experience, defects of the sort noted by Tom are quite
possible and if significant to your application, should be eliminated
by specification and TESTED independently (ie not by the mfr).

Andy Saulietis
Andy Saulietis / ISS Alt-Az-Fp Drive Systems
HDPE Worm Gears, Custom designed mount/telescopes & Machine work
CCD filter wheels & other custom accessories
39 Silver Fox Trail
Cloud Country Estates
Mayhill NM 88339
505-687-3067 Voice
505-687-3021   Fax
e-mail: iss@pvtnetworks.net
32 54 13 N  105 31 44 W 7300' elev

-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From Paul.Jorden at eev.com  Wed Apr 21 16:46:46 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:46 2004
Subject: Spots
Message-ID: <TFSNINWE@eev.com>

Posted to CCD-world:
-+-+-+-
 > > Posted to CCD-world:
 > > -+-+-+-
 > > The Amateur Sky Survey now has several 2k x 2k CCD cameras running
 > > using the CCD442A.  We have bought the Grade 4 (lowest cost) devices.
 > >
 > > On one of the cameras, I see large round dark spots.  One is a few
 > > hundred pixels in diameter.  Others are smaller.  Most of these spots
 > > represent lower sensitivity of a few percent.  One has increased 
sensitivity.
 > > Being the tass list, these have sparked a debate as to their source. 
 We are
 > > running the present CCDs with covers.  (CCDs are now on order without
 > > covers.)  In my opinion, the edges of the spots are too sharp to be
 > > due to dirt on the cover or in the optics.  The spots are on the only 
CCD
 > > with a bad column, indicating that this is possibly a lower grade 
overall
 > > device.
 > >
 > > Can anyone tell me if such spots are common on a CCD?
 >
 > Not at all. I think You should use better CCD grade if possible. We
 > normally use best grade CCD and dont have similar problems.
 >
I agree; good (or even poor) CCDs don't normally have such features- 
especially if they are round, and hundreds of pixels across.  The spots 
sound very much like 'dust rings' caused by out-of-focus dust spots on cover 
glass, or fiters etc.  Reasonably sharp-looking annular rings can be caused 
by contamination in front of the focal plane.  It depends somewhat on the 
nature of your illumination.

Regards,
Paul J
_______________________________________________________________
Dr Paul Jorden,  CCD Sensors, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

-+-+-+-
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From Jenichen at proscan.de  Wed Apr 21 17:43:11 1999
From: Jenichen at proscan.de (Dr. Frank W. Jenichen)
Date: Thu Jul 29 11:54:46 2004
Subject: Spots
References: <3.0.32.19990420132241.00e88ad8@miso.wwa.com>
Message-ID: <371DF20E.DBC3140B@proscan.de>

Posted to CCD-world:
-+-+-+-
Tom Droege schrieb:

> Posted to CCD-world:
> -+-+-+-
> The Amateur Sky Survey now has several 2k x 2k CCD cameras running
> using
> the CCD442A.  We have bought the Grade 4 (lowest cost) devices.
>
> On one of the cameras, I see large round dark spots.  One is a few
> hundred
> pixels in diameter.  Others are smaller.  Most of these spots
> represent
> lower sensitivity of a few percent.  One has increased sensitivity.
> Being
> the tass list, these have sparked a debate as to their source.  We are
>
> running the present CCDs with covers.  (CCDs are now on order without
> covers.)  In my opinion, the edges of the spots are too sharp to be
> due to
> dirt on the cover or in the optics.  The spots are on the only CCD
> with a
> bad column, indicating that this is possibly a lower grade overall
> device.
>
> Can anyone tell me if such spots are common on a CCD?

Not at all. I think You should use better CCD grade if possible. We
normally use best grade CCD and dont have similar problems.

> Flat fielding mostly
> removes the problem, so this in not all that serious a defect.
>
> Tom Droege
> -+-+-+-
> For information about CCD-world, send email to
> owner-CCD-world@cfht.hawaii.edu.


greetings
--
Frank Jenichen
==================================
Proscan elektronische Systeme GmbH
D- 86937 Scheuring, Lechstrasse 40
Tel.: +49 8195 999 -511 Fax.: -512
      http://www.proscan.de
==================================


-+-+-+-
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From droege at wwa.com  Tue Apr 20 13:22:43 1999
From: droege at wwa.com (Tom Droege)
Date: Thu Jul 29 11:54:46 2004
Subject: Spots
Message-ID: <3.0.32.19990420132241.00e88ad8@miso.wwa.com>

Posted to CCD-world:
-+-+-+-
The Amateur Sky Survey now has several 2k x 2k CCD cameras running using
the CCD442A.  We have bought the Grade 4 (lowest cost) devices.

On one of the cameras, I see large round dark spots.  One is a few hundred
pixels in diameter.  Others are smaller.  Most of these spots represent
lower sensitivity of a few percent.  One has increased sensitivity.  Being
the tass list, these have sparked a debate as to their source.  We are
running the present CCDs with covers.  (CCDs are now on order without
covers.)  In my opinion, the edges of the spots are too sharp to be due to
dirt on the cover or in the optics.  The spots are on the only CCD with a
bad column, indicating that this is possibly a lower grade overall device.  

Can anyone tell me if such spots are common on a CCD?  Flat fielding mostly
removes the problem, so this in not all that serious a defect. 

Tom Droege
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From Peter.Pool at eev.com  Fri Apr 16 18:22:47 1999
From: Peter.Pool at eev.com (Peter.Pool@eev.com)
Date: Thu Jul 29 11:54:46 2004
Subject: Looking for a 1" (or greater) 1D CCD
Message-ID: <TFSOPIBW@eev.com>

Posted to CCD-world:
-+-+-+-
Hi

That's a good idea Tom, this would allow a variable long dimension of the 
"pixel".
You may even consider EEV CCD42-10:  2k x 512, 13.5?m pixels, back 
illuminated for excellent QE.  See www.ccd.eev.com

Peter Pool
EEV

 ----------
From: droege@wwa.com
To: CCD-world@cfht.hawaii.edu
Subject: Re: Looking for a 1" (or greater) 1D CCD with ~ 9-10 um pixels.
Date: 16 April 1999 14:04

<<File Attachment: ENVELOPE.TXT>>
Posted to CCD-world:
 -+-+-+-
The Sony data book does say that their tests are done with an IR cutoff
filter.
Why not use the Hammamatsu 2D devices and a little more electronics.  Just
shift the pixels into the output.  You should be able to do this quickly.

Tom Droege

At 05:25 PM 4/15/99 -0700, you wrote:
>Posted to CCD-world:
>-+-+-+-
>Hello all:
>
>I am looking for a CCD chip that is at least 25.4 mm in length
>and has 9-10 um pixels by 200 um height minimum.  It should
>be a 1-D array with good QE, sensitivity, low noise, and relatively
>low dark current.  The specs for the current chip I am using are:
>
>SONY ILX511
>Temp:              25 deg C
>Clock Frequency:   1 MHz
>Light Source:      3200 K
>IR Cut Filter:          CM-500S (t = 1.0 mm)
>
>QUESTION:     Are these tests done with an IR cutoff filter??  QE curves
>too??
>         That could explain a lot.
>
>QE:      Peaks at ~450 nm (absolute value unknown).
>Sensitivity:  200 V/(lx*s), uniform intensity illumination
>         1800 V/(lx*s)  LED at 660 nm
>
>Dark Voltage: 3.0 mV (10 msec integration, 25 deg C)
>Saturation
>Output Voltage:    800 mV
>Saturation
>Exposure:     0.004 lx*s (for white light exposure)
>
>
>Any suggestions would be appreciated.
>
>Dr. Scott Sutherland
>Senior Scientist
>GAMMA-METRICS
>-+-+-+-
>For information about CCD-world, send email to
owner-CCD-world@cfht.hawaii.edu.
>
>
 -+-+-+-
For information about CCD-world, send email to
owner-CCD-world@cfht.hawaii.edu.


-+-+-+-
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From droege at wwa.com  Fri Apr 16 07:44:39 1999
From: droege at wwa.com (Tom Droege)
Date: Thu Jul 29 11:54:46 2004
Subject: Looking for a 1" (or greater) 1D CCD with ~ 9-10 um pixels.
Message-ID: <3.0.32.19990416074436.00eb40e8@miso.wwa.com>

Posted to CCD-world:
-+-+-+-
The Sony data book does say that their tests are done with an IR cutoff
filter.
Why not use the Hammamatsu 2D devices and a little more electronics.  Just
shift the pixels into the output.  You should be able to do this quickly.  

Tom Droege

At 05:25 PM 4/15/99 -0700, you wrote:
>Posted to CCD-world:
>-+-+-+-
>Hello all:
>
>I am looking for a CCD chip that is at least 25.4 mm in length
>and has 9-10 um pixels by 200 um height minimum.  It should
>be a 1-D array with good QE, sensitivity, low noise, and relatively
>low dark current.  The specs for the current chip I am using are:
>
>SONY ILX511
>Temp:			25 deg C
>Clock Frequency:	1 MHz
>Light Source:		3200 K
>IR Cut Filter:		CM-500S (t = 1.0 mm)
>
>QUESTION:  	Are these tests done with an IR cutoff filter??  QE curves
>too??
>		That could explain a lot.
>
>QE:		Peaks at ~450 nm (absolute value unknown).
>Sensitivity:	200 V/(lx*s), uniform intensity illumination
>		1800 V/(lx*s)	LED at 660 nm
>
>Dark Voltage:	3.0 mV (10 msec integration, 25 deg C)
>Saturation
>Output Voltage:	800 mV
>Saturation
>Exposure:	0.004 lx*s (for white light exposure)
>
>
>Any suggestions would be appreciated.
>
>Dr. Scott Sutherland
>Senior Scientist
>GAMMA-METRICS
>-+-+-+-
>For information about CCD-world, send email to
owner-CCD-world@cfht.hawaii.edu.
>
>
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From ssutherl at gammametrics.com  Thu Apr 15 17:15:58 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:46 2004
Subject: Looking for additional performance data for SONY ILX511 or a subs
	titute.
Message-ID: <1583828ED67FD211A31D006008277B19012F17@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
I realize this may be somewhat off topic, but it does deal with
CCD's.  

Ocean Optics, a manufacturer of compact spectrographs, uses
a 'CCD' chip from SONY (ILX511) as their detector.  I have 
downloaded the specs from the SONY web site for this chip, but 
the specs don't provide data in the same units I am used to seeing
from suppliers such as EEV.  Relevant numbers for me are dark
current (electrons per pixel per second), ACTUAL QE (not relative,
as in the data sheet, or at least relative and the actual value
for the max), readout noise, etc.

I am trying to get a handle on the capabilities of this chip versus
others I have tested for which I did have the above data.  I have
already found that some of the data on the sheet does not seem
to coincide with what I observe.  For example, the Saturation Output
Voltage is listed as 800 mV.  The average dark current at 25 deg C 
is listed as 3.0 mV (note says 10 msec integration time).  This
leads to a dynamic range spec of 267.  However, I have an Ocean
Optics S2000 spectrometer with this chip in it.  It uses a 12-bit A/D
converter.  If I integrate for 40 seconds, the average pixel value
is near 1200 counts (~ 1/4 saturation), with quite a few pixels
saturating).  However, according to the SONY specs, if the detector
generates 3.0 mV in 10 msec, the detector SHOULD saturate
in 2.67 seconds.  I cannot rectify this, the Ocean Optics people are
no help, and neither are the SONY people.

The major problem for the SONY chip in my application is that 
the QE peaks at ~ 460 nm.  I am working in either the 850-1070 nm
or 785-1000 nm range for my application.  The detector actually works
reasonably well for the 785-1000 nm range (surprisingly so), but I
need to move to the longer wavelength range above.  Two manufacturers
of competitive products use the Toshiba TCD1201D (same pixel size
and number).  It has a QE that peaks at ~ 575 nm, which is much better
than the SONY.

Another thing that troubles me.  One of the sensitivity tests quoted
utilizes
a 660 nm LED.  The sensitivity of the SONY at 660 nm is ~ 55% of the peak
QE.  The sensitivity of the TOSHIBA at 660 nm is ~ 90% of the max.  However,
the actual sensitivity values for the two chips is 

SONY:		1800 V/(lx*s)
TOSHIBA	600 V/(lx*s)

This is confusing.  I assume the QE of the devices is ~ the same at peak, or
within
25%.  The TOSHIBA is a photodiode array, and I assume it has a peak QE of
at least 50%.  The SONY is called a CCD (I have heard it referred to as a 
photodiode array with a CCD readout register.  Which is correct?), and I
would
anticipate its peak QE to be no more than 50% either.

Can anyone explain why the SONY is so much more sensitive at 660 nm than the
Toshiba?

Does anyone know of a 2048 (or higher) pixel array, with similar pixel
dimensions,
that has a peak QE nearer to the red but has similar or higher sensitivity
than
the SONY?  Of course dark current and dynamic range should be at least that
of the SONY.

Any insights you can provide would be appreciated.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From ssutherl at gammametrics.com  Thu Apr 15 17:25:31 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:46 2004
Subject: Looking for a 1" (or greater) 1D CCD with ~ 9-10 um pixels.
Message-ID: <1583828ED67FD211A31D006008277B19012F18@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
Hello all:

I am looking for a CCD chip that is at least 25.4 mm in length
and has 9-10 um pixels by 200 um height minimum.  It should
be a 1-D array with good QE, sensitivity, low noise, and relatively
low dark current.  The specs for the current chip I am using are:

SONY ILX511
Temp:			25 deg C
Clock Frequency:	1 MHz
Light Source:		3200 K
IR Cut Filter:		CM-500S (t = 1.0 mm)

QUESTION:  	Are these tests done with an IR cutoff filter??  QE curves
too??
		That could explain a lot.

QE:		Peaks at ~450 nm (absolute value unknown).
Sensitivity:	200 V/(lx*s), uniform intensity illumination
		1800 V/(lx*s)	LED at 660 nm

Dark Voltage:	3.0 mV (10 msec integration, 25 deg C)
Saturation
Output Voltage:	800 mV
Saturation
Exposure:	0.004 lx*s (for white light exposure)


Any suggestions would be appreciated.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From jphil at cfa0.harvard.edu  Fri Apr  9 08:50:06 1999
From: jphil at cfa0.harvard.edu (James Phillips)
Date: Thu Jul 29 11:54:46 2004
Subject: Detecting AC signal on top of a DC w
In-Reply-To: <TFSJXVBG@eev.com> (Paul.Jorden@eev.com)
References: <TFSJXVBG@eev.com>
Message-ID: <199904091250.IAA26418@cfa0.harvard.edu>

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From Paul.Jorden at eev.com  Fri Apr  9 12:26:52 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:46 2004
Subject: Detecting AC signal on top of a DC w
Message-ID: <TFSJXVBG@eev.com>

Posted to CCD-world:
-+-+-+-
To Scott, et al,
 >
 > The ICCD is not an option for me.  Is there any way, using
 > an integrating detector like a CCD, to detect a modulated
 > signal over a DC (or slowly varying) background that
 > includes a continuum (e.g. incandescent) and discrete
 > line (e.g. fluorescent) sources?

There is one possible technique that astronomers have used (for polarisation 
or 'high speed' sampling).
You essentially divide the image area of the CCD into three zones, the 
centre of which is illuminated.  You project your signal onto the centre, 
and this can have a slow modulation (say 10Hz, square wave preferable).
After integrating for one half cycle you rapidly transfer to say the upper 
storage zone.
You then integrate for the other half cycle, followed by a rapid tranfer to 
the lower storage zone.
This process can be repeated for multiple cycles.  The upper zone could 
integrate  the signal + background, whilst the other would integrate only 
background.
At the end of the total sampling period, read out the whole area, and 
subtract the upper and lower zones to get the net signal.

I cannot tell whether the figures work out well enough for your application. 
 For example 128 rows could be shifted in ~5 uS each (600 uS total); this 
transfer time could be negligible compared to a zone integration time of say 
50 mS- corresponding to a 10 Hz total modulation cycle.  Perhaps all these 
rough figures could be improved upon.
Total number of integrations per zone is limted by dark current or ambient 
background.

 > The operating temperature of the CCD will be ~ -10 deg C
 >  so there is significant dark current (~ 50 electrons per pixel per
 > second),.......... Thus, I am dark current limited.
 >
I would have thought that dark current could be ~ 10 e-/pix/sec for an 
inverted mode device, with ~20 um pixels.  Less with smaller pixels.
Presumably you are concentrating the light as much as possible to maximise 
signal/pixel.

I'll be interested to hear any comments.

Regards,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

-+-+-+-
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From fbarbosa at inaoep.mx  Tue Apr  6 13:02:09 1999
From: fbarbosa at inaoep.mx (Francisco Barbosa)
Date: Thu Jul 29 11:54:46 2004
Subject: To build or to buy ? That is the question.
References: <2E9A618C.C7C6487D@ull.es>
Message-ID: <370A5A31.74EDE40E@inaoep.mx>

Posted to CCD-world:
-+-+-+-
 Dear CCD  Friends

   At the National Institute of Astrophysics Optics and Electronics (INAOE) of
Puebla, M?xico we are trying to make a prototype of a Near Infrared Camera.
We have a large format (1024 x 1024) HgCdTe Focal Plane Array from Rockwell.
We propose to design and construc the mechanics, the optics, and the electronics
for an infrered camera  spectrograph cooled to 77K.
About the electronics, design considerations include precise timer for the detector
control, fiber optics for communication with the control computer, and analog to
digital conversion after the data acquisition phase.


    If anyone knows a good controller for these array and anything concerning this
subject we will appreciate a response.

    Yours

Francisco Barbosa E
Instrumentation an Control Head
INAOE
Luis Enrique Erro No.1
Tonantzintla, Pue 72840
M?xico.
Fax +522 247 2231
mailto: fbarbosa@inaoep.mx


-+-+-+-
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From droege at wwa.com  Fri Apr  2 10:56:53 1999
From: droege at wwa.com (Tom Droege)
Date: Thu Jul 29 11:54:46 2004
Subject: Detecting AC signal on top of a DC with a CCD
  (non-intensified)?
Message-ID: <3.0.32.19990402095612.00e86bc4@miso.wwa.com>

Posted to CCD-world:
-+-+-+-
Scott,

Well the first thing that comes to mind is to have a second probe that sees
only background and not the signal and subtract it.  One never does this
very well, so you might gain a factor of 5 or so.  I might have better
suggestions if I knew more what you are trying to do.  It is always tough
to remove such background once it is there.  So best to think hard about
how the detector is designed to get a better signal from the start.  

Tom Droege

At 05:04 PM 4/1/99 -0800, you wrote:
>Posted to CCD-world:
>-+-+-+-
>Hello all:
>
>I have somewhat of a dilemma I am trying to resolve.
>I have an optical sensor application in which I am trying

-+-+-+-
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From theuwiss at natlab.research.philips.com  Fri Apr  2 14:19:53 1999
From: theuwiss at natlab.research.philips.com (dr.ir. A.J.P. Theuwissen)
Date: Thu Jul 29 11:54:47 2004
Subject: Optical transmission of "IR filters" on camcorder CCD's?
References: <1583828ED67FD211A31D006008277B19012F06@mail.gammametrics.com>
Message-ID: <3704A7D9.CC660116@natlab.research.philips.com>

Posted to CCD-world:
-+-+-+-
Dear Mr. Sutherland,


You are fully correct that for ALL CCD applications in consumer fields,
IR blocking filters are used.  A typical example is the C500 filter made
by HOYA.  But different manufacturers of the CCD cameras are using
different filters.  The IR-filter should be more or less tuned to the
colour filter characteristics of the on-chip filters.

Kind regards,

Albert Theuwissen,
R&D manager Imaging Devices, Philips Semiconductors

Sutherland, Scott wrote:
> 
> Posted to CCD-world:
> -+-+-+-
> Hello:
> 
> I have read that on commercial camcorders a filter is used
> to block NIR light from the CCD.  Does anyone know who
> manufacturers these filters?  Can someone point me to a
> optical transmission curve of these filters so I can see the
> % transmission in the visible, the cutoff wavelength/slope,
> and the effective blocking in the NIR?
> 
> Thanks for any information.
> 
> Dr. Scott Sutherland
> Senior Scientist
> GAMMA-METRICS
> -+-+-+-
> For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

-- 
------------------------------------------------------------------------------
N E W   F A X N U M B E R  !!!!!  (since 20-01-1999)
Theuwissen, dr.ir. A.J.P.    		Philips Semiconductors
Building: WAG1-3-15  			Philips Imaging Technology
Phone: +31 40 274 2734  		Prof. Holstlaan, 4 / MS WAG-05
Fax:   +31 40 274 4090 			5656 AA Eindhoven
Mob:   +31 65 345 2707			The Netherlands
E-mail: theuwiss@natlab.research.philips.com
http://www.semiconductors.philips.com/imagers/
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From ssutherl at gammametrics.com  Thu Apr  1 18:04:57 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:47 2004
Subject: Detecting AC signal on top of a DC with a CCD (non-intensified)?
Message-ID: <1583828ED67FD211A31D006008277B19012F07@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
Hello all:

I have somewhat of a dilemma I am trying to resolve.
I have an optical sensor application in which I am trying
to detect relatively low light levels of signal in the 850-1100
nm range.  However, the system must be run outside
any enclosure (using a fiber optic probe) and must
discriminate ambient light (fluorescent, incandescent,
and sunlight) from the signal.  Most solutions to this kind
of problem involve using a pulsed source and either gating
for an integrating detector (CCD, PDA) or demodulation
of a CW signal (e.g. a photomultiplier tube of photodiode).

The ICCD is not an option for me.  Is there any way, using
an integrating detector like a CCD, to detect a modulated
signal over a DC (or slowly varying) background that
includes a continuum (e.g. incandescent) and discrete
line (e.g. fluorescent) sources?  Keep in mind that this
is a 16 bit CCD application and the detectors I am using
are operated in binned mode.  The current system bins
128 pixels and has a total readout maximum speed
(including binning) of 6 msec.  If necessary, I could
go to a 14 bit or even 12 bit (with reservations) system.

The operating temperature of the CCD will be ~ -10 deg
C (less than that draws too much power for the battery
powered application, and LN2 is not practical), so there
is significant dark current (~ 50 electrons per pixel per
second), read noise is ~ 15 electrons (in the current
module, which could be changed), and a typical maximum
signal level (best case) is ~ 100,000 electrons per pixel
per second (fully binned pixel, so no more than 900 electrons
per individual pixel per second (thus low light), and as low
as 10-20 e/p/s).  Thus, I am dark current limited.

Any pointers to technology, literature references, etc. would
be appreciated.

Thanks for any suggestions.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS

BTW, I know Perkin Elmer tried to address this problem in 
a UV/Vis spectrometer with a PDA detector and ended up
with a single channel, scanning PMT based system and a 
very bright pulsed light source to eliminate ambient light
problems.  Not too encouraging a start, is it?  Unfortunately,
such an option is not viable for us.


-+-+-+-
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From ssutherl at gammametrics.com  Thu Apr  1 17:48:50 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:47 2004
Subject: Optical transmission of "IR filters" on camcorder CCD's?
Message-ID: <1583828ED67FD211A31D006008277B19012F06@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
Hello:

I have read that on commercial camcorders a filter is used
to block NIR light from the CCD.  Does anyone know who
manufacturers these filters?  Can someone point me to a 
optical transmission curve of these filters so I can see the
% transmission in the visible, the cutoff wavelength/slope,
and the effective blocking in the NIR?

Thanks for any information.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From jbeletic at eso.org  Thu Apr  1 18:46:55 1999
From: jbeletic at eso.org (James Beletic)
Date: Thu Jul 29 11:54:47 2004
Subject: ESO CCD Workshop -- 13-16 September, 1999
Message-ID: <b329509871021004f21b@[134.171.12.59]>

Posted to CCD-world:
-+-+-+-

                                        1 April 1999

Dear CCD World,

    The next version of the ESO CCD Workshop has been scheduled
for 13-16 September 1999.  There will be 3 days of meetings / talks /
roundtable discussions, etc. preceded by an evening reception on
13 September.  If possible, we will have a visit to Wacker wafer
fabrication facility during the day of 13 September, for those who
wish to arrive early.  There will be a social event (with workshop
dinner) on the evening of 15 September.

    To make life easiest, we will have a single workshop fee of
250 DM, with all activities (including conference dinner, trip to
Wacker, cool t-shirt, etc.) included in the workshop fee.

    We will limit the workshop to 100 participants.  Enough hotel
space has been reserved in Garching so that all can lodge within
walking distance of ESO.

    There will be further announcements as to program committee, schedule,
etc. in May, as well as an on-line registration Web page.  We send this
notice now to give time for you to arrange inexpensive air fares.

    For those who are interested, the Oktoberfest runs from 18 September
to 3 October.

    I apologize for the delay in sending this announcement; it has been
a very busy time at ESO lately.

                                        Best wishes,

                                            Jim

P.S.    This is not an April Fools joke!

P.P.S.  Any ideas on program, etc. for the workshop are most appreciated.


=========================================================================
    James W. Beletic, Ph.D.                  E-mail:  jbeletic@eso.org
    Head of the Optical Detector and Adaptive Optics Groups
    European Southern Observatory            Phone:   +49-89-320-06520
    Karl-Sch-Str 2, D-85748 Garching, GER    FAX:     +49-89-320-2362
=========================================================================


-+-+-+-
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From gordon_hopkinson at siraeo.co.uk  Thu Apr  1 12:59:11 1999
From: gordon_hopkinson at siraeo.co.uk (Hopkinson, Gordon)
Date: Thu Jul 29 11:54:47 2004
Subject: outgassing
Message-ID: <9D70BF372E81D2119C3900609769B49F02FD9A@server1.sireo.co.uk>

Posted to CCD-world:
-+-+-+-
Hello CCD world

We regularly build CCD electronics for the space environment and have no
particular problems with outgassing.  To be accurate, tantalum capacitors
are also electrolytics but they have a solid rather than a liquid
dielectric.

Normally we would choose components from a space approved list but there is
not usually a problem with modern ceramic capacitors (particularly surface
mount).  

Conformally coating the PCBs is a good idea (e.g. with solithane). We would
do this as a matter of routine.  After coating, the board is baked in vacuum
on its own (without any optics) to 'condition' it.

Best regards

Gordon Hopkinson
Sira Electro-Optics Ltd

-+-+-+-
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From gordon_hopkinson at siraeo.co.uk  Thu Apr  1 13:01:06 1999
From: gordon_hopkinson at siraeo.co.uk (Hopkinson, Gordon)
Date: Thu Jul 29 11:54:47 2004
Subject: QE versus temperature
Message-ID: <9D70BF372E81D2119C3900609769B49F02FD9B@server1.sireo.co.uk>

Posted to CCD-world:
-+-+-+-
Hello CCD world

I've recently checked out the QE versus temperature effect and basically
agree with Andor's curves at long wavelengths.  The effect is due to the
change in absorption length as you approach the cut-off at 1.1 microns.

I have used the expression : a(l) = [(84.732/l) - 76.417] from [1] (a in
cm-1, l in mm), and an expression for the temperature shift from [2].

[1]   E. S. Nartowitz and A. M. Goodman, " Evaluation of silicon optical
absorption data for use in minority-carrier-diffusion-length measurements by
the SPV method", J. Electrochem. Soc., vol. 132(12), pp 2992-2997 (1985)

[2]    H. A. Weakliem and D. Redfield, "Temperature dependence of the
optical properties of silicon", J. Appl. Phys. Vol. 50 (3), pp1491-1493
(1979)

To model the QE for a thinned CCD you need to take into account the multiple
reflections.

The effect at wavelengths below about 800nm may be due to changes in
reflection coefficient and some CCDs (particularly lumogen-coated) have
instabilities in the blue, but in general there shouldn't be much change
below 800nm so I don't know why Andor  show the large changes at low
wavelengths.

Best regards

Gordon Hopkinson
Sira Electro-Optics Ltd

-+-+-+-
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From wpk at saao.ac.za  Thu Apr  1 10:32:37 1999
From: wpk at saao.ac.za (Willie Koorts)
Date: Thu Jul 29 11:54:47 2004
Subject: Vaccum material reference list
In-Reply-To: <36FE356A.7A648C9F@eso.org>
Message-ID: <Pine.OSF.3.91.990401090616.12258B-100000@da.saao.ac.za>

Posted to CCD-world:
-+-+-+-

On Sun, 28 Mar 1999, Gustavo Rahmer wrote:

> Posted to CCD-world:
> -+-+-+-
> Has anybody experience with contamination in vacuum (outgassing) coming from
> capacitors (ceramic, electrolytic, etc.) and also different ceramic types 
> like NPO, X7R, Z5U?

Dear Gustavo

Refering to my posting to the list last December describing how the
plastisizer Di(2-Ethylhexyl) Phthalate (C24H38O4) was identified as the
contaminant of our CCD dewars - see:
http://www.cfht.hawaii.edu/~tmca/CCD-world/CCD-world.98.hypermail/0142.html

Quoting from the website   http://www.nsc.org/ehc/ew/chems/diphthal.htm 
the Chemical Backgrounder info on this substance: "As a non-plasticizer,
di(2-ethylhexyl) phthalate is used as a replacement for polychlorinated
biphenyls (PCBs) in dielectric fluids for electric capacitors."

I am sure the last word must read "eletrolytic capacitors" which would 
make me reluctant to use any inside a vacuum.  We have used Tantulum and 
Ceramic capacitors inside the vacuum before, without any ill effects as 
far as we could tell.  Just be extremely careful never to apply reverse 
polarity to a tantulum, I can only image the mess when blowing one up 
under vacuum!

Regards
Willie

                       Mr. W.P. Koorts ( wpk@saao.ac.za )    
                     South African Astronomical Observatory 
                   PO Box 9   Observatory  7935  South Africa
                 Tel.(27) (21) 447 0025  Fax.(27) (21) 447 3639
               World   Wide   Web  ( Work ) http://www.saao.ac.za
             World Wide Web ( Personal ) http://www.saao.ac.za/~wpk/
-+-+-+-
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From fhh at nofs.navy.mil  Wed Mar 31 12:32:25 1999
From: fhh at nofs.navy.mil (fhh@nofs.navy.mil)
Date: Thu Jul 29 11:54:47 2004
Subject: Vaccum material reference list
Message-ID: <199903311832.AA18111@ccder.nofs.navy.mil>

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From ssutherl at gammametrics.com  Wed Mar 31 10:33:28 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:47 2004
Subject: QE effected by operating temperature?
Message-ID: <1583828ED67FD211A31D006008277B19012F04@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
Hello all:

I was recently on a web page of a company called
Andor, a manufacturer of spectroscopic components,
among which are CCD cameras.  On their
web page they have a chart of wavelength dependent
quantum efficiencies as a function of the operating
temperature of the CCD.

See:  http://www.andor-tech.com/relqe.html

Now I have read that the transfer efficiency of charges
to the readout register are adversely affected by
very low temperatures (one reason for not cooling 
below LN2), and that readout noise can decrease
at low temperatures, and of course that dark
current is lower at lower temperatures,
but I was unaware of the dramatic effect temperature
has on QE.

Is the curve at the above web site typical of most CCD's?

What causes such a dramatic wavelength dependent 
QE versus temperature?

We work in the 850-1050 nm range, where the effect
is significant.  I had always considered the use of
lower temperatures (e.g. multi-stage TE coolers,
water circulation, etc.) as a trade off between cost
and complexity versus lower dark current.  However,
with this graph, I see that a significant trade off
has to be made between QE and dark current when
determining the operating temperature of the CCD.

Any additional info on this effect would be greatly appreciated.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS
-+-+-+-
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From jphil at cfa0.harvard.edu  Wed Mar 31 11:09:34 1999
From: jphil at cfa0.harvard.edu (James Phillips)
Date: Thu Jul 29 11:54:47 2004
Subject: No subject
In-Reply-To: <199903311341.PAA28220@aibn55.astro.uni-bonn.de>
	(philipp@astro.uni-bonn.de)
References: <199903311341.PAA28220@aibn55.astro.uni-bonn.de>
Message-ID: <199903311509.KAA24040@cfa0.harvard.edu>

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From ATWOOD at mps.ohio-state.edu  Wed Mar 31 10:37:31 1999
From: ATWOOD at mps.ohio-state.edu (ATWOOD@mps.ohio-state.edu)
Date: Thu Jul 29 11:54:47 2004
Subject: Vacuum material reference list
In-Reply-To: "Your message dated Wed, 31 Mar 1999 10:07:05 -0300"
 <199903311307.GAA75707@noao.edu>
Message-ID: <01J9H4MQZJDY8WXBUM@mps.ohio-state.edu>

Posted to CCD-world:
-+-+-+-
It is, in fact, possible to design CCD and IR array electronics without locating
electronic components in a vacuum or cold without any preformance penality.  Doing
so frees one to use any component, not just those suitable for cold/vacuum, and 
makes development much faster.
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From ATWOOD at mps.ohio-state.edu  Wed Mar 31 10:37:31 1999
From: ATWOOD at mps.ohio-state.edu (ATWOOD@mps.ohio-state.edu)
Date: Thu Jul 29 11:54:47 2004
Subject: Vacuum material reference list
In-Reply-To: "Your message dated Wed, 31 Mar 1999 10:07:05 -0300"
 <199903311307.GAA75707@noao.edu>
Message-ID: <01J9H4MQZJDY8WXBUM@mps.ohio-state.edu>

Posted to CCD-world:
-+-+-+-
It is, in fact, possible to design CCD and IR array electronics without locating
electronic components in a vacuum or cold without any preformance penality.  Doing
so frees one to use any component, not just those suitable for cold/vacuum, and 
makes development much faster.
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From philipp at astro.uni-bonn.de  Wed Mar 31 16:41:16 1999
From: philipp at astro.uni-bonn.de (Philipp)
Date: Thu Jul 29 11:54:47 2004
Subject: No subject
Message-ID: <199903311341.PAA28220@aibn55.astro.uni-bonn.de>

Posted to CCD-world:
-+-+-+-
Hello CCD World,

We are using preamplifiers next to the CCD inside the dewar?s for 10 jears. 
We had never problems with outgassing components. The temperature of the PCB 
is between -60C and -80C. For small values we use NPO and COG capacitors. 
You can operate these even at 10K (Radioastronomical Application). Larger 
capacitors are of the type MKT. (Tantal is also possible)
A simple check is: Measure the capacitance while you dip the C in LN2.

Philipp


Philipp M?ller
Radioastr. Inst. University of Bonn

philipp@astro.uni-bonn.de

   

-+-+-+-
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From theuwiss at natlab.research.philips.com  Wed Mar 31 16:22:14 1999
From: theuwiss at natlab.research.philips.com (dr.ir. A.J.P. Theuwissen)
Date: Thu Jul 29 11:54:47 2004
Subject: MPP mode
References: <01be785b$4f7be7f0$ebb2a58b@soho.csl.ulg.ac.be>
Message-ID: <37022186.5AB0DD5A@natlab.research.philips.com>

Posted to CCD-world:
-+-+-+-
Dear Jean Marc,


You can find all the information you are looking for (MPP mode,
inversion mode, back-side illumination, 3-phase transport, open-phase
pinning, virutal phase, etc.) in the book "Solid-State Imaging with
Charge-Coupled Devices", ISBN 0792334566, published by Kluwer Academic
Publishers, Dordrecht (NL).  I know that the price of this particular
book is a little bit high, but the price setting is done by the
publisher.  If the author had been able to fix the price, then it was
much .... ?????

Kind regards,


Albert Theuwissen.

Jean Marc DEFISE wrote:
> 
> Posted to CCD-world:
> -+-+-+-
> For educational purposes, I am looking for a good explanation of the MPP
> mode in a back illuminated thinned CCD as well as for the inverted mode.
> 
> I am also looking for a sketch showing explicitly the MPP implant in a
> backside CCD with 3 electrodes/pixel.
> 
> To avoid annoying this group with a basic question, you can redirect me to a
> good reference.
> 
> Thank you.
> 
> Jean Marc DEFISE
> 
> CENTRE SPATIAL DE LIEGE
> Avenue du Pre Aily B-4031 Angleur BELGIUM
> www.ulg.ac.be/cslulg
> jmdefise@ulg.ac.be
> ===========================================
> 
> -+-+-+-
> For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

-- 
------------------------------------------------------------------------------
N E W   F A X N U M B E R  !!!!!  (since 20-01-1999)
Theuwissen, dr.ir. A.J.P.    		Philips Semiconductors
Building: WAG1-3-15  			Philips Imaging Technology
Phone: +31 40 274 2734  		Prof. Holstlaan, 4 / MS WAG-05
Fax:   +31 40 274 4090 			5656 AA Eindhoven
Mob:   +31 65 345 2707			The Netherlands
E-mail: theuwiss@natlab.research.philips.com
http://www.semiconductors.philips.com/imagers/
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From roger at ctios1.ctio.noao.edu  Wed Mar 31 11:07:05 1999
From: roger at ctios1.ctio.noao.edu (Roger Smith CTIO - rsmith@noao.edu)
Date: Thu Jul 29 11:54:47 2004
Subject: Vacuum material reference list
Message-ID: <199903311307.GAA75707@noao.edu>

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From jmdefise at ulg.ac.be  Sat Mar 27 16:08:38 1999
From: jmdefise at ulg.ac.be (Jean Marc DEFISE)
Date: Thu Jul 29 11:54:47 2004
Subject: MPP mode
Message-ID: <01be785b$4f7be7f0$ebb2a58b@soho.csl.ulg.ac.be>

Posted to CCD-world:
-+-+-+-
For educational purposes, I am looking for a good explanation of the MPP
mode in a back illuminated thinned CCD as well as for the inverted mode.

I am also looking for a sketch showing explicitly the MPP implant in a
backside CCD with 3 electrodes/pixel.


To avoid annoying this group with a basic question, you can redirect me to a
good reference.


Thank you.

Jean Marc DEFISE

CENTRE SPATIAL DE LIEGE
Avenue du Pre Aily B-4031 Angleur BELGIUM
www.ulg.ac.be/cslulg
jmdefise@ulg.ac.be
===========================================

-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From grahmer at eso.org  Sun Mar 28 10:58:03 1999
From: grahmer at eso.org (Gustavo Rahmer)
Date: Thu Jul 29 11:54:47 2004
Subject: Vaccum material reference list
References: <01BE7207.898BCA50@pdx86.pdx.oneworld.com>
Message-ID: <36FE356A.7A648C9F@eso.org>

Posted to CCD-world:
-+-+-+-
Has anybody experience with contamination in vacuum (outgassing) coming from
capacitors (ceramic, electrolytic, etc.) and also different ceramic types like NPO,
X7R, Z5U?
And also how does capacitance change below the specified minimum operational
temperature (normally -55 degC)?

Gustavo.


Joe Imamura wrote:

> Posted to CCD-world:
> -+-+-+-
> Is there a reference listing of the "best" materials to the "worst" materials
> for Vaccum and high Vaccum? I used a reference book at my previous job
> but had to leave it. I remember that any of the "INCONEL" is the best, then
> stainless steel, aluminum,etc.
> JOE IMAMURA
> PIXELVISION,INC
> BEAVERTON,OR
> (503) 629-3210 X334
> (503) 629-3211
> E-MAIL : joei@pvinc.com
> -+-+-+-
> For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.



--
 ------------------------------------------------------------------------
 Gustavo Rahmer Bass                     e-mail: grahmer@eso.org
 ESO - European Southern Observatory     phone: +49-89-32006547
 Garching b. Munich
 GERMANY
 ------------------------------------------------------------------------


-+-+-+-
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From cdm at ast.cam.ac.uk  Tue Mar 23 11:53:00 1999
From: cdm at ast.cam.ac.uk (Craig D Mackay)
Date: Thu Jul 29 11:54:47 2004
Subject: Measured QE performance of HAWAII arrays
References: <199903190134.MAA13130@aaossn.aao.gov.au>
Message-ID: <36F7728C.5C1DC5A1@ast.cam.ac.uk>

Posted to CCD-world:
-+-+-+-
Dear Chris

There is a QE curve for the HAWAII arrays on:

http://www.rsc.rockwell.com/websearch/mct_fpa/Hawaii/histo_qe.html

We have had five of these arrays in Cambridge for the CIRSI camera
system (http://www.ast.cam.ac.uk/~optics/cirsi/).   We have measured
standard stars in different colours, and find that the relative quantum
efficiencies are all rather similar, implying (to the 10 percent level)
that the QE curve slopes are similar.   Chip-to-chip differences could
be due to QE differences or to gain differences, but again we find the
chips are all within +/- 10 percent, and these differences could reflect
partially sky transparency variations.

We do not have calibrated test gear here so cannot give lab results of
any real meaning in this respect.   We have accepted these devices as
God-given, and found that they work on telescopes much as you would
expect from the Rockwell measurements, which we generally find to be a
good guide to the performance we actually see.

Best Wishes

Craig D Mackay
Institute of Astronomy
University of Cambridge.
-+-+-+-
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From Peter.Pool at eev.com  Mon Mar 22 16:15:12 1999
From: Peter.Pool at eev.com (Peter.Pool@eev.com)
Date: Thu Jul 29 11:54:48 2004
Subject: Vacuum materials
Message-ID: <TFSMALCA@eev.com>

Posted to CCD-world:
-+-+-+-
Hi

     Apart from making CCDs,  EEV make vacuum tubes.   In our experience, 
 for the temperature range envisaged for a dewar, the choice of material is 
not too difficult .

     What is most important is a low absorbency surface (not anodised) and 
the ability to remove low vapour pressure contaminants from that surface. 
   A raw machined surface inevitably includes "rolled over" surface features 
which trap machining oil etc.   This is best removed by de-greasing followed 
by acid etching ,  to give an open surface.   Provided this surface is kept 
clean (no finger grease) it will not be a significant outgassing source. 
  If you really want to minimise the surface area, use stainless steel, 
electro-polished after construction.

Peter Pool
EEV CCDs

-+-+-+-
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From payne at stars.gsfc.nasa.gov  Mon Mar 22 10:02:38 1999
From: payne at stars.gsfc.nasa.gov (Mr. Leslie Payne)
Date: Thu Jul 29 11:54:48 2004
Subject: Vaccum material reference list
References: <01BE7207.898BCA50@pdx86.pdx.oneworld.com>
Message-ID: <36F6699E.16338BB5@stars.gsfc.nasa.gov>

Posted to CCD-world:
-+-+-+-
You can try this web-site from Goddards material branch:

http://arioch.gsfc.nasa.gov/313

At the bottom of the page is a link to a material databases.  I hope it is of
help.

Les


Joe Imamura wrote:
> 
> Posted to CCD-world:
> -+-+-+-
> Is there a reference listing of the "best" materials to the "worst" materials
> for Vaccum and high Vaccum? I used a reference book at my previous job
> but had to leave it. I remember that any of the "INCONEL" is the best, then
> stainless steel, aluminum,etc.
> JOE IMAMURA
> PIXELVISION,INC
> BEAVERTON,OR
> (503) 629-3210 X334
> (503) 629-3211
> E-MAIL : joei@pvinc.com
> -+-+-+-
> For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

-- 


*********************************************************************************
Mr. Leslie Payne                                voice: 301-286-8988
Goddard Space Flight Center                     fax: 301-286-1753
Code 686                                        email: payne@stars.gsfc.nasa.gov
Greenbelt, MD 20771
USA
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From harrison at ll.mit.edu  Mon Mar 22 08:59:31 1999
From: harrison at ll.mit.edu (Harrison, David)
Date: Thu Jul 29 11:54:48 2004
Subject: Vaccum material reference list
Message-ID: <199903221306.IAA04641@ll.mit.edu>

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From joei at pvinc.com  Fri Mar 19 13:53:49 1999
From: joei at pvinc.com (Joe Imamura)
Date: Thu Jul 29 11:54:48 2004
Subject: Vaccum material reference list
Message-ID: <01BE7207.898BCA50@pdx86.pdx.oneworld.com>

Posted to CCD-world:
-+-+-+-
Is there a reference listing of the "best" materials to the "worst" materials
for Vaccum and high Vaccum? I used a reference book at my previous job
but had to leave it. I remember that any of the "INCONEL" is the best, then
stainless steel, aluminum,etc.
JOE IMAMURA
PIXELVISION,INC
BEAVERTON,OR
(503) 629-3210 X334
(503) 629-3211
E-MAIL : joei@pvinc.com 
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From ATWOOD at mps.ohio-state.edu  Fri Mar 19 09:48:28 1999
From: ATWOOD at mps.ohio-state.edu (ATWOOD@mps.ohio-state.edu)
Date: Thu Jul 29 11:54:48 2004
Subject: cyropumping materials
In-Reply-To: "Your message dated Fri, 19 Mar 1999 08:26:22 -0500 (EST)"
 <199903191326.IAA22260@cfa.harvard.edu>
Message-ID: <01J90BESK28M8WWH3N@mps.ohio-state.edu>

Posted to CCD-world:
-+-+-+-
1.  Put your charcoal in a box lined with filter paper to keep the dust down.

2.  Since charcoal does not trap water at room temperature the only way to
get water out of your Dewar is to pump for a very long time, waiting for the
water to come off the inner surfaces.  If you don't remove the water you can
wind up with the water on your chip as the system warms up or froming clouds
when you backfill your system.  I have gone to cold charcoal to "pump" the
air that diffuses through the o-rings and a WARM, easy to change, canister
of zeolite to pump the water.  Zeolite activated at 350 C will hold the water
partial pressure to a few microns and when you change it you are removing the water
from the system.  In fact one change a few weeks after pumping a Dewar is all
that is required unless it is open for a long time (days).

-+-+-+-
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From geary at cfa.harvard.edu  Fri Mar 19 09:26:22 1999
From: geary at cfa.harvard.edu (John Geary)
Date: Thu Jul 29 11:54:48 2004
Subject: cyropumping materials
Message-ID: <199903191326.IAA22260@cfa.harvard.edu>

Posted to CCD-world:
-+-+-+-
The recent discussion of the (non)desireablility of putting porous anodized
surfaces in vacuum touched on another side of vacuum practise, the use of
cold porous materials for cleaning up the dewar vacuum and especially for
sucking up residual water vapor.  Many of us use cold activated charcoal,
which has the advantage over zeolite materials in outgassing thoroughly at
room temperature, without radical heating needed.  However, it is in
practise a rather dirty material from a dust standpoint, which will
invariably be deposited on your CCD surface as if it were a magnet (it seems).

So, is there something more "solid" we could use?  I was thinking about cold
sintered bronze, often used for air filters and the like.  Anyone know
anything about this, or other materials?

--JG


"When the chips are down, the buffalo is empty"  -Anon.

-+-+-+-
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From tabbott at sparc.not.iac.es  Fri Mar 19 11:50:06 1999
From: tabbott at sparc.not.iac.es (Tim Abbott)
Date: Thu Jul 29 11:54:48 2004
Subject: Web pages
Message-ID: <199903191050.KAA22869@sparc2.not.iac.es>

Posted to CCD-world:
-+-+-+-

It occurs to me that rather than have everyone tout their web pages
in CCD-world, perhaps I can recommend that people check to see if their
pages are linked to from the CCD-world home page under the "resources" 
link (or Willie's page, or the Yunnan list). If your page is _not_ there, 
please let me know and I will add it.  I can then, later, send this 
page to CCD-world and everyone will have the full list.

The CCD-world web pages are at:

	http://www.cfht.hawaii.edu/~tmca/CCD-world/

After all, discussion about web pages about detectors is not discussion
about detectors...

Tim  (Moderate? Me?)

P.S.  Thanks to all for their comments about anodising within vacuums,
I am consistently amazed by what the members of this list have learned
over the years.

-- 
Tim Abbott                                                    tabbott@not.iac.es
Support Astronomer                               http://www.not.iac.es/~tabbott/
                           Nordic Optical Telescope
       Apartado 474 E-38700, Santa Cruz de La Palma, Canary Islands, Spain

-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From wpk at saao.ac.za  Fri Mar 19 13:32:24 1999
From: wpk at saao.ac.za (Willie Koorts)
Date: Thu Jul 29 11:54:48 2004
Subject: CCD websites
In-Reply-To: <199903180328.RAA27202@uwila.cfht.hawaii.edu>
Message-ID: <Pine.OSF.3.91.990319122502.13518H@da.saao.ac.za>

Posted to CCD-world:
-+-+-+-

On Thu, 18 Mar 1999 kfji@hotmail.com wrote:

> I found a new CCD web, it is not bad.
> http://ccd.ourfamily.com
> Jack

For some time now, I have kept a similar (but not graphically as fancy) 
set of links, mostly gleaned from CCD-World contributer's signitures when
posting to the list, at:   http://www.saao.ac.za/~wpk/ccdworld.html
With the closure of RGO, a lot of these are probably now outdated, so any 
corrections, additions, etc. are welcomed.

The cryogenic workers might also find my vacuum links handy at: 
http://www.saao.ac.za/~wpk/vacuum.html

Again, contributions, etc. are welcome.

Willie

                       Mr. W.P. Koorts ( wpk@saao.ac.za )    
                     South African Astronomical Observatory 
                   PO Box 9   Observatory  7935  South Africa
                 Tel.(27) (21) 447 0025  Fax.(27) (21) 447 3639
               World   Wide   Web  ( Work ) http://www.saao.ac.za
             World Wide Web ( Personal ) http://www.saao.ac.za/~wpk/
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From cgt at aaoepp.aao.GOV.AU  Fri Mar 19 13:34:08 1999
From: cgt at aaoepp.aao.GOV.AU (Chris Tinney)
Date: Thu Jul 29 11:54:48 2004
Subject: Measured QE performance of HAWAII arrays
Message-ID: <199903190134.MAA13130@aaossn.aao.gov.au>

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From kfji at hotmail.com  Thu Mar 18 12:28:48 1999
From: kfji at hotmail.com (kfji@hotmail.com)
Date: Thu Jul 29 11:54:48 2004
Subject: No subject
Message-ID: <199903180328.RAA27202@uwila.cfht.hawaii.edu>

Posted to CCD-world:
-+-+-+-
I found a new CCD web, it is not bad.
http://ccd.ourfamily.com
Jack

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From MYPIXEL at aol.com  Thu Mar 18 01:37:03 1999
From: MYPIXEL at aol.com (MYPIXEL@aol.com)
Date: Thu Jul 29 11:54:48 2004
Subject: CCD pixel-to-pixel variations
	boundary="part0_921735424_boundary"
Message-ID: <c3d89ca.36f090ff@aol.com>

***********************************************jj
Paul. . . .

below . .  . 

Jim
***************************************************jj


In a message dated 3/17/99 1:22:54 AM Pacific Standard Time,
Paul.Jorden@eev.com writes:

<< >
  > Has anyone any knowledge on how pixel-pixel QE variations
  > changes as a function of
  >
  > 1) Wavelength
  > 2) Time >>


**************************jj
Might throw in my two cents worth . . . . . not already mentioned . . .

Pixel nonuniformity is dependent on clock bias. For example, two barrier
phases that are exactly equal in potential will produce the greatest
nonuniformity (charge has a hard time knowing how to divide). If these
voltages vary slightly a new nonuniformity pattern is seen. Sometimes it is
necessary to slightly offset barrier phases to help direct charge to the
collecting phase consistently. Integrating under two phases (as opposed to
one) helps this problem. Attached find a plot of pixel nonuniformity as a
function of negative bias to barrier phases 2  and 3 leaving the collecting
phase at 7 V. Note that pixel nonuniformity is greatest when the two barrier
phases are equal in potential. Taking a CCD into inversion also reduces pixel
nonuniformity by pinning and flattening small potential barriers under a phase
(how most pixel nonuniformity originates). 

Residual Bulk Image (RBI) also adds instability to pixel nonuniformity. All
frontside CCDs built on epitaxial material show QE instability (i.e., traps at
epi interface). The problem is a red one where absorption length is longer
than the epi thickness. For the Hubble, Galileo, SXT and Cassini CCDs the QE
varied as much as 10 % depending on signal level and operating temperature.
For Galileo and Cassini an IR light flood was required before each exposure to
stabilize QE to 1%.

RBI becomes obvious for operating temperatures below -60 C and wavelengths
longer than 7000 A. Backside CCDs do not exhibit RBI in that epi interface
(where traps are located) is thinned away. Excess dark current from the same
region is seen when a dark frame is taken after a high level exposure (hence
the name residual bulk image). The time constant associated with RBI is
exponentially dependent on operating temperature (from usec to hours).

Dark current nonuniformity. .  . another interesting subject to get into   ..
. . . 

Jim

**********************************************jj
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From Paul.Jorden at eev.com  Wed Mar 17 18:21:15 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:48 2004
Subject: CCD pixel-to-pixel variations
Message-ID: <TFSNSPCD@eev.com>

Posted to CCD-world:
-+-+-+-
Hi Klaus, & everyone,

 > >QUESTION #1:
 > > Since no light is falling on the CCD during the dark frame
 > > exposure, what value of the PRNU would I use, since it
 > > shows such dramatic variations as a function of wavelength
 > > in the table above?
 > >
 >
 >    we have found that the pixel-to-pixel QE variation (i.e. PRNU)
 > and the pixel-to-pixel variation of thermal electron generation
 > (no acronym so far?) are different by an order of magnitude or
 > more. We have seen values for the latter of 20 to 30 percent
 > (standard deviation) at room temperature. PRNU values were
 > usually between a few and less then 1 percent as indicated
 > in the EEV table. These two effects should therefore be considered
 > and corrected separately.
 >
At EEV we use the term 'DSNU' (dark signal non uniformity). cf PRNU (pixel 
response non uniformity).
It is a measure of fluctuating dark signal generation, and in general is not 
related to PRNU (which is a measure of response fluctuations).  It should 
scale with temperature in the same way as global dark current.

In general DSNU is irrelevant, and not measured for cryogenic astronomy 
devices.

PRNU can be ~1% or less. (removed by flat field division)
DSNU will be ~10% or more. (removed by bias subtraction)

Regards,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

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From ATWOOD at mps.ohio-state.edu  Wed Mar 17 11:31:05 1999
From: ATWOOD at mps.ohio-state.edu (ATWOOD@mps.ohio-state.edu)
Date: Thu Jul 29 11:54:48 2004
Subject: CCD pixel-to-pixel variations
In-Reply-To: "Your message dated Tue, 16 Mar 1999 10:04:10 -0800"
 <1583828ED67FD211A31D006008277B19012EE6@mail.gammametrics.com>
Message-ID: <01J8XMFBR6628WWATF@mps.ohio-state.edu>

Posted to CCD-world:
-+-+-+-
										
You must separately correct for the additive and multiplicative errors.  Subtract
off the BIAS frame, which may or may not have structure, then you must divide by the
true response for each pixel to the wavelength that will be used for an observation.
Great care must be taken to be sure that this FLAT FIELD correction is done
from data that is taken with the same wavelength that is used for your observations.
For example, the night sky is very hot compared to filament lamps and it is easy
to see the difference between "sky flats" and "lamp flats".  (Obviously you must subtract
a bias frame from your flat fields.)

The general question of the stability of the QE(x,y,wavelength) is complicated and,
I think, not well understood.  We have a large data set from the YALO telescope,
a years worth of every night imaging, that should be analyzed to see if the night
by night calibration strategy is best or if the system (not just the CCD) is  stable
enough that flats and darks should be averaged over a longer time scale.  Even so, results 
one detector should not be generalized to any CCD.  The CCD on the YALO (a LLICK3 
2k square) shows very little, or no, QE hysteresis some other devices have very large changes
in QE with exposure history.  The problem of "fringing" (high spatial frequency sensitivity 
variations when a CCD is illuminated with narrowband red light...what is narrow and red varies
with the device) is more complicated and requires even greater stability of the wavelength vs
x and y.

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From reif at astro.uni-bonn.de  Wed Mar 17 12:50:44 1999
From: reif at astro.uni-bonn.de (Klaus Reif)
Date: Thu Jul 29 11:54:48 2004
Subject: CCD pixel-to-pixel variations
In-Reply-To: <36EF643D.C6D0AE1A@natlab.research.philips.com>
References: <Pine.SUN.3.91.990316132607.4999A-100000@lpss1.ing.iac.es>
 <36EE7EBD.E1C9AB7F@routes.com>
Message-ID: <3.0.6.32.19990317115044.007ebc40@aibn55>

Posted to CCD-world:
-+-+-+-
 The term "pixel-to-pixel variation of thermal electron generation"
could in my last mail be misunderstood. 
What I'm talking about is - more precisely - the 
"pixel-to-pixel variation of thermal electron generation efficiency".

Klaus Reif
*******************************************************************
Klaus Reif
Sternwarte of the Univ. of Bonn                 Phone:    +49 228 737834
Auf dem Huegel 71                                   FAX:     +49 228 733672
D 53121 Bonn                                          Email:
reif@astro.uni-bonn.de
Germany                                                   WWW:
http://www.astro.uni-bonn.de/~reif
*******************************************************************





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From reif at astro.uni-bonn.de  Wed Mar 17 12:21:52 1999
From: reif at astro.uni-bonn.de (Klaus Reif)
Date: Thu Jul 29 11:54:48 2004
Subject: CCD pixel-to-pixel variations
In-Reply-To: <1583828ED67FD211A31D006008277B19012EE6@mail.gammametrics.c
 om>
Message-ID: <3.0.6.32.19990317112152.007de8a0@aibn55>

Posted to CCD-world:
-+-+-+-
Hello Scott,

>QUESTION #1:
>	Since no light is falling on the CCD during the dark frame
>	exposure, what value of the PRNU would I use, since it
>	shows such dramatic variations as a function of wavelength
>	in the table above?
>

   we have found that the pixel-to-pixel QE variation (i.e. PRNU) 
and the pixel-to-pixel variation of thermal electron generation
(no acronym so far?) are different by an order of magnitude or
more. We have seen values for the latter of 20 to 30 percent
(standard deviation) at room temperature. PRNU values were 
usually between a few and less then 1 percent as indicated 
in the EEV table. These two effects should therefore be considered 
and corrected separately. 

Klaus Reif


*******************************************************************
Klaus Reif
Sternwarte of the Univ. of Bonn                 Phone:    +49 228 737834
Auf dem Huegel 71                                   FAX:     +49 228 733672
D 53121 Bonn                                          Email:
reif@astro.uni-bonn.de
Germany                                                   WWW:
http://www.astro.uni-bonn.de/~reif
*******************************************************************





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From theuwiss at natlab.research.philips.com  Wed Mar 17 10:13:49 1999
From: theuwiss at natlab.research.philips.com (dr.ir. A.J.P. GST Theuwissen)
Date: Thu Jul 29 11:54:48 2004
Subject: CCD pixel-to-pixel variations
References: <Pine.SUN.3.91.990316132607.4999A-100000@lpss1.ing.iac.es> <36EE7EBD.E1C9AB7F@routes.com>
Message-ID: <36EF643D.C6D0AE1A@natlab.research.philips.com>

Posted to CCD-world:
-+-+-+-
Dear all,


We, at Philips, do tests of the PNRU for every device we ship to our
customers.  For the large area devices (pixel size 12 um, with vertical
anti-blooming) we measure the following typical values : @ 450 nm : 0.52
%, @ 550 nm : 0.54 % and @ 650 nm : 0.61 %.  
As far as the stability of PNRU is concerned : our Quality and
Reliability program, which is applied to all our product, never showed
any degradation of the PNRU.  (Q&R tests include 1000 hours @ 150 deg.
C, 1000 hours @ -60 deg. C, etc.)

Kind regards,


Albert Theuwissen
R&D manager Imaging Devices
Philips Semiconductors Image Sensors



Ken Smith wrote:
> 
> Posted to CCD-world:
> -+-+-+-
> Dr Smartt:
> 
> I have actual test data from EEV on PRNU (photoresponse non-uniformity) vs
> wavelength for the CCD-26, which is a 1353x286 frame transfer spectroscopic CCD,
> thinned, MPP (IMO) mode.  They used a monochronometer I believe.  So here goes:
> 
> Wavelength (nm)    PRNU (%)
> 
> 250                7.2
> 270                7.4
> 300                7.2
> 350                2.5
> 400                1.4
> 450                1.2
> 500                1.0
> 550                1.0
> 600                0.97
> 675                0.95
> 755                2.4
> 765                2.8
> 775                3.4
> 925                16.3
> 940                18.1
> 955                20.0
> 
> I don't have actual image data at each wavelength from which the above numbers were
> determined, so I don't know how PRNU varies spatially, other than I suspect it
> changes slowly over the CCD due to different thinkness of the wafer etc.
> 
> As far as long term variation in PRNU is concerned, I am looking for that sort of
> data myself.  I suspect data is available, but not in any convenient summary form,
> but just massive raw flat field calibration archives.  The Hubble Space Telescope
> web site may have a lot of such data on line, but the CCD is subject to space
> radiation effects.  You also have to be careful in making sure in what conditions
> was the CCD kept in interpreting the data.  Was it always in vacuum, N2, in and out
> of a cooler, handling, does it have a UV coating or other surface treatments, UV
> flash, etc ?  Otherwise you will have an apples and oranges situation.  I believe
> the EEV CCD you are talking about is thinned and any treatments/coatings would be
> fairly stable.
> 
> Ken Smith
> Routes Inc
> Ottawa, ON
> Canada
> 
> -+-+-+-
> For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

-- 
------------------------------------------------------------------------------
N E W   F A X N U M B E R  !!!!!  (since 20-01-1999)
Theuwissen, dr.ir. A.J.P.    		Philips Semiconductors
Building: WAG1-3-15  			Philips Imaging Technology
Phone: +31 40 274 2734  		Prof. Holstlaan, 4 / MS WAG-05
Fax:   +31 40 274 4090 			5656 AA Eindhoven
Mob:   +31 65 345 2707			The Netherlands
E-mail: theuwiss@natlab.research.philips.com
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From waterson at banana.IfA.Hawaii.Edu  Tue Mar 16 10:00:28 1999
From: waterson at banana.IfA.Hawaii.Edu (Mark Waterson)
Date: Thu Jul 29 11:54:49 2004
Subject: Cold, anodized surfaces
References: <199903150937.JAA14472@sparc2.not.iac.es>
Message-ID: <36EEAA4C.EEE4C70C@koa.ifa.hawaii.edu>

Posted to CCD-world:
-+-+-+-
When I worked for Argonne National Labs on their Cryo particle
accelerators, anodizing anything in the dewar was verbotten (tho we
didn't have the specific data David O. mentions). People generally
stayed away from aluminum parts at all, actually. You would want a much
more chemically reactive surface than anodizing generates to be an
effective getteer anyway - the idea of the anodize is to prevent
reaction with the environment rather than encourage it.
-- 
   mfw

Mark Waterson     UH-IfA      Mees Solar Observatory
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From ssutherl at gammametrics.com  Tue Mar 16 11:04:10 1999
From: ssutherl at gammametrics.com (Sutherland, Scott)
Date: Thu Jul 29 11:54:49 2004
Subject: CCD pixel-to-pixel variations
Message-ID: <1583828ED67FD211A31D006008277B19012EE6@mail.gammametrics.com>

Posted to CCD-world:
-+-+-+-
Hello all:

Let me see if I understand what these results mean.  Ken Smith wrote:

> I have actual test data from EEV on PRNU (photoresponse non-uniformity) vs
> wavelength for the CCD-26, which is a 1353x286 frame transfer
> spectroscopic CCD,
> thinned, MPP (IMO) mode.  They used a monochronometer I believe.  So here
> goes:
> 
> Wavelength (nm)    PRNU (%)
> 
> 250                7.2
> 270                7.4
> 300                7.2
> 350                2.5
> 400                1.4
> 450                1.2
> 500                1.0
> 550                1.0
> 600                0.97
> 675                0.95
> 755                2.4
> 765                2.8
> 775                3.4
> 925                16.3
> 940                18.1
> 955                20.0
> 
> 
I use CCD's for spectroscopy, usually fully vertically
binned.  Because I run them at fairly high temperatures
(-10 deg C), I get a significant dark current (e.g. 1% of
the saturation level of the binning register per second).
In addition, if I average, say, 100 dark frames at 50% 
saturation, I can remove almost all the random, white
noise from the binned spectrum, but I am left with
a fixed pattern of pixel to pixel variations which I assumed
were due to QE variations (e.g. PRNU).

QUESTION #1:
	Since no light is falling on the CCD during the dark frame
	exposure, what value of the PRNU would I use, since it
	shows such dramatic variations as a function of wavelength
	in the table above?

Once I store this 'master' dark frame in memory, I then procede to 
illuminate the CCD with light from my sample.  However, the light
from the sample contains many discrete wavelengths and often
a slowly varying DC background.  I subtract the stored master
dark frame from this spectrum to remove the fixed pattern
background (the one I thought was from PRNU) while minimizing
the effect of adding noise to the final spectrum (thus the reason
for the 'master' dark frame).

Since the PRNU varies dramatically with wavelength, according
to the table above, my 'dark frame subtraction' technique outlined
above will not work, since the dark frame 'pattern' was generated
with no light falling on the CCD and the spectrum, with its
accompanying PRNU variations, was generated with light falling
on it with the wavelengths dispersed across the width of the CCD.
Is this correct?

Now, I do generate a 'throughput' correction spectrum, to correct
for wavelength dependent transmission of my optical elements,
and to correct for wavelength dependent QE variations on the CCD.
I use a calibrated Tungsten Halogen lamp as a source, placed at
the same point in my system where the sample usually goes, and
generate a spectrum.  I fit the actual calibrate output to a function
(4th order polynomial) and ratio the measured spectrum to the 
known spectrum to produce a 'white light' correction function.
Each raw 'data' spectrum that is generated with the instrument 
is multiplied by this correction spectrum to correct for 
these throughput variations.

QUESTION #2:
	With such a throughput correction correct properly for 
the variations in PRNU that are present in my particular CCD?

If not, any suggestions as to how to correct this?  I cannot
easily generate a 'white light' flat field correction on my CCD,
as one would for a telescope system, because it is directly coupled
to the wavelength dispersing spectrograph in my system.

Any suggestions would be appreciated.

Thanks.

Dr. Scott Sutherland
Senior Scientist
GAMMA-METRICS

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From Paul.Jorden at eev.com  Tue Mar 16 17:53:14 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:49 2004
Subject: Cold, anodized surfaces
Message-ID: <TFSNJBOF@eev.com>

Posted to CCD-world:
-+-+-+-
Jim et al,
 >
 >  Colored anodizing was explained to me 15 yrs ago as follows: creation of 
a
 > honeycomb on the surface, *filling it with dye*, then capping it to hold
 > the dye in.  The dye is not perfectly held in by the cap.  When the 
system
 > is under vacuum but not yet cold, isn't the dye likely to migrate to 
places
 > you don't want it?
 >
As you say, any dye would be undesirable!  Also, even if no dye is used, the 
anodising is a wet process, and in general it is unlikely that the material 
is cleaned well afterwards, bearing in mind the porosity.

Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

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From Paul.Jorden at eev.com  Tue Mar 16 17:53:18 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:49 2004
Subject: CCD pixel-to-pixel variations 
Message-ID: <TFSNJAZW@eev.com>

Posted to CCD-world:
-+-+-+-
Steve, and ccd-world,
 >
 > Has anyone any knowledge on how pixel-pixel QE varitions
 > changes as a function of
 >
 > 1) Wavelength
 > 2) Time
 >
 > I'm looking for quantitative real results, but theory guesses
 > are welcome !
 >
Don't forget you need to state whether the chip is frontside or backside; I 
assume you are mainly interested in backside chips.

I have measured intra-pixel QE as a function of wavelength before, as I 
guess you know.
I can merely 'guess' about (2)

 > These variations are traditionally removed (or at least attempts
 > are bravely made) by high-quality flat-fielding at the wavelength one is
 > observing at. But has anyone done any quantitaive tests of how dependent 
the
 > RATIO's of pix-pix variations are on wavelength ?
 >
I guess the intra-pixel variation can give you an upper limit on how bad it 
can be, especially if the projected slit width is quite small.
Frontside chips, could be quite dependent on wavelength, since interference 
effects in the electrodes are very strong.  For backside cillumination, 
these effects come into play around the same wavelengths as fringing 
(>800nm).

However at the very shortest wavelengths (<400nm) you will be very sensitive 
to surface effects.  So pixel modulation will increase at these short 
wavelengths, and decrease as you move longer.  Hence PRNU is worst at short 
wavelength.

So I would guess, on thin chips results could be quite good for wavelengths 
of 400-800nm especially.  I think you ought to be able to take 'superflats' 
at a few wavelengths, and interpolate simply between them.
 >
 > Also, the pix-pix variations would need to be constant a
 > function of time. Has anyone any experience of this also ?
 >
I would expect them to be stable.  Dominant effects are the intrinsic 
spatial structure of the device.  I could only imagine slow changes with 
time on a low spatial frequency, if you had contamination build up on the 
chip for example.
Basically most things are stable with time (temperature, chip operating 
conditions, hopefully illumination conditions,...)
You might have problems if the cryostat or spectrograph setup changed (eg 
dismounting/remounting cryostat.
I suspect the dominant factor will be wavelength stability.

 > We are intending to do these experiments at ING, but any
 > advice or results that has already been done would be
 > very much appreciated. We will try this out with a 1k Tek
 > and an EEV42-80.
 >
I'll be very interested in the results.

Cheers,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/
 

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From jmdefise at ulg.ac.be  Tue Mar 16 18:38:42 1999
From: jmdefise at ulg.ac.be (Jean Marc DEFISE)
Date: Thu Jul 29 11:54:49 2004
Subject: Cold, anodized surfaces
Message-ID: <01be6fcb$73aec3b0$ebb2a58b@soho.csl.ulg.ac.be>

Posted to CCD-world:
-+-+-+-
>From my own experience with space hardware, mineral black anodizing is a
usual process for aluminum parts in optical systems. The natural anodizing
is porous, but in this case it is filled with the mineral dyes used to
blacken the surface. The organic dyes (e.g. used for window frames) are not
suitable for outgassing reasons.

Using mineral anodizing is not considered as a sorb. It is equivalent to
alodine (eridite) coating of aluminum.

On the other hand, uncoated aluminum is naturally covered by the oxyde Al2O3
which is porous. I would say that alodine or mineral anodization is always
preferred for vacuum applications.

Best regards,

Jean-Marc Defise

===========================================
Jean Marc DEFISE
CENTRE SPATIAL DE LIEGE
Avenue du Pre Aily B-4031 Angleur BELGIUM
www.ulg.ac.be/cslulg
jmdefise@ulg.ac.be
===========================================

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From smithk at routes.com  Tue Mar 16 11:54:37 1999
From: smithk at routes.com (Ken Smith)
Date: Thu Jul 29 11:54:49 2004
Subject: CCD pixel-to-pixel variations
References: <Pine.SUN.3.91.990316132607.4999A-100000@lpss1.ing.iac.es>
Message-ID: <36EE7EBD.E1C9AB7F@routes.com>

Posted to CCD-world:
-+-+-+-
Dr Smartt:

I have actual test data from EEV on PRNU (photoresponse non-uniformity) vs
wavelength for the CCD-26, which is a 1353x286 frame transfer spectroscopic CCD,
thinned, MPP (IMO) mode.  They used a monochronometer I believe.  So here goes:

Wavelength (nm)    PRNU (%)

250                7.2
270                7.4
300                7.2
350                2.5
400                1.4
450                1.2
500                1.0
550                1.0
600                0.97
675                0.95
755                2.4
765                2.8
775                3.4
925                16.3
940                18.1
955                20.0

I don't have actual image data at each wavelength from which the above numbers were
determined, so I don't know how PRNU varies spatially, other than I suspect it
changes slowly over the CCD due to different thinkness of the wafer etc.

As far as long term variation in PRNU is concerned, I am looking for that sort of
data myself.  I suspect data is available, but not in any convenient summary form,
but just massive raw flat field calibration archives.  The Hubble Space Telescope
web site may have a lot of such data on line, but the CCD is subject to space
radiation effects.  You also have to be careful in making sure in what conditions
was the CCD kept in interpreting the data.  Was it always in vacuum, N2, in and out
of a cooler, handling, does it have a UV coating or other surface treatments, UV
flash, etc ?  Otherwise you will have an apples and oranges situation.  I believe
the EEV CCD you are talking about is thinned and any treatments/coatings would be
fairly stable.


Ken Smith
Routes Inc
Ottawa, ON
Canada


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From jphil at cfa0.harvard.edu  Tue Mar 16 11:39:56 1999
From: jphil at cfa0.harvard.edu (James Phillips)
Date: Thu Jul 29 11:54:49 2004
Subject: Cold, anodized surfaces
In-Reply-To: <TFSKLSSV@eev.com> (Paul.Jorden@eev.com)
References: <TFSKLSSV@eev.com>
Message-ID: <199903161539.KAA10024@cfa0.harvard.edu>

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From sjst at ing.iac.es  Tue Mar 16 14:54:21 1999
From: sjst at ing.iac.es (Stephen Smartt)
Date: Thu Jul 29 11:54:49 2004
Subject: CCD pixel-to-pixel variations 
Message-ID: <Pine.SUN.3.91.990316132607.4999A-100000@lpss1.ing.iac.es>

Posted to CCD-world:
-+-+-+-

Has anyone any knowledge on how pixel-pixel QE varitions 
changes as a function of 

1) Wavelength
2) Time

I'm looking for quantitative real results, but theory guesses 
are welcome !

These variations are traditionally removed (or at least attempts
are bravely made) by high-quality flat-fielding at the wavelength one is 
observing at. But has anyone done any quantitaive tests of how dependent the 
RATIO's of pix-pix variations are on wavelength ?

The idea behind this is that a set of super-flats could be 
provided to observers for specific wavelength regions per CCD in 
e.g. long-slit spectrographs. There are of course instrument 
issues involved in this also, but some spectrographs would 
lend themselves to this type of calibration if the 
pix-pix response was not steeply dependent on wavelength. 
e.g can a spectroscopic W flat in the region 4500-4700 be used 
to remove pix-pix variations in the 5000-5200 region ?

Also, the pix-pix variations would need to be constant a 
function of time. Has anyone any experience of this also ?

We are intending to do these experiments at ING, but any
advice or results that has already been done would be 
very much appreciated. We will try this out with a 1k Tek
and an EEV42-80. 

regards
steve 

-----------------------------------------------------------------------------
 Dr. Stephen J. Smartt            ING Support Astronomer
                                  email: sjst@ing.iac.es
 Isaac Newton Group               Tel (Mountain): +34 22 405655     
 Apartado de Correos 368          Tel (Sea-Level: +34 22 425439     
 Santa Cruz de La Palma, 38700    Fax (Mountain)  : +34 22 405646     
 Canary Islands,Spain             Fax (Sea Level) : +34 22 425401        
----------------------------------------------------------------------------







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From Paul.Jorden at eev.com  Tue Mar 16 14:12:40 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:49 2004
Subject: Cold, anodized surfaces
Message-ID: <TFSKLSSV@eev.com>

Posted to CCD-world:
-+-+-+-
Tim, & ccd-world,
 >
 > Does anyone have any experience of the gettering (or otherwise)
 > properties of cold, anodized surfaces within a dewar (that is,
 > _not_ the inner surface of the outer shell, but parts of a cold
 > table, etc.)...?
 >
As Dave has now said, the anodised surface will be very porous, and 
presumably a good getter.  Certainly (at RGO) we avoided it inside the 
dewar- as a warm surface- because it could outgas so much water vapour, 
 Presumably when cold, it will trap this.  I don't have any direct knowledge 
of what it does to other materials.
I still think I would avoid anodising in general, unless I wanted it to 
deliberately function as a sorb.  In this case, I would keep it separate 
from the detector vicininty- to allow independent temp. control, and 
minimise contamination.
Presumably a purpose-made sorb material has a higher efficiency.

If you want a vacuum refererence, have a look at:
     'Modern Vacuum Practice' Nigel Harris 1989 McGraw Hill
     ISBN 0-07-707099-2

By the way, I believe 'sorption' means the reversible process of trapping & 
releasing gases (eg zeolite, or other sorbs, used in cryostats). 
 'gettering' is chemi-sorption, which is a chemical trapping, and not 
reversible in general.

Cheers,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

-+-+-+-
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From douellette at as.arizona.edu  Mon Mar 15 11:17:03 1999
From: douellette at as.arizona.edu (David Ouellette)
Date: Thu Jul 29 11:54:49 2004
Subject: anodized surfaces
Message-ID: <01BE6ECC.F95C1DA0@aspc77.as.arizona.edu>

Posted to CCD-world:
-+-+-+-

I'm not sure exactly what information you are after, but I offer the following information from the Newport catalog #100 p. B-4:

" Anodizing [italicized] has a particularly dramatic effect on outgassing rates.  The beautiful etched surface produced by anodizing is sponge-like on a microscopic level and has a true surface area many times its apparent size.  For example, the true area of a piece of bare aluminum is only six times its geometric area; when anodized, the area is effectively multiplies 400 to 900 [italicized] times.  Typical anodized aluminum contributes 3E-7 Torr-liter/sec of outgassing per square centimeter per mil thickness [italicized] of surface. "

There is more information, and makes for a quick read with the morning's coffee. 

--Dave

David Ouellette
Steward Observatory
CCD Laboratory
933 N. Cherry Avenue
Tucson, AZ  82721-0065  

Phone:  520-621-5228
Fax:	520-626-4330
Email:  douellette@as.arizona.edu
Web: http://sauron.as.arizona.edu/ccdlab/

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From tabbott at sparc.not.iac.es  Mon Mar 15 10:37:18 1999
From: tabbott at sparc.not.iac.es (Tim Abbott)
Date: Thu Jul 29 11:54:49 2004
Subject: Cold, anodized surfaces
Message-ID: <199903150937.JAA14472@sparc2.not.iac.es>

Posted to CCD-world:
-+-+-+-

Dear CCD-world,

Does anyone have any experience of the gettering (or otherwise)
properties of cold, anodized surfaces within a dewar (that is,
_not_ the inner surface of the outer shell, but parts of a cold
table, etc.)...?

Cheers,

	Tim

P.S.  it's been a bit quiet around here lately...

-- 
Tim Abbott                                                    tabbott@not.iac.es
Support Astronomer                               http://www.not.iac.es/~tabbott/
                           Nordic Optical Telescope
       Apartado 474 E-38700, Santa Cruz de La Palma, Canary Islands, Spain
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From dji at roe.ac.uk  Wed Feb 17 21:08:19 1999
From: dji at roe.ac.uk (Derek Ives)
Date: Thu Jul 29 11:54:49 2004
Subject: HAWAII questions
Message-ID: <Pine.SOL.3.96.990217195921.4328D-100000@alba.roe.ac.uk>

Posted to CCD-world:
-+-+-+-

Dear all,
	having agreed that we can use this forum for both the NIR and CCD 
worlds, I would like to hear your experiences of using the Rockwell HAWAII
arrays.

We have been running our science device and are experiencing
certain characteristics of the devices. Namely:-

1. even though we use off chip JFET source followers and short the on chip
FETs, we still see glow from a corner of each quadrant.

2. if we illuminate one quandrant with the dummy star, then we see a ghost
image of this in our other quadrants.

3. we see remenance type effects which decay over a period of minutes.

I know that many of you out there are experiencing similar sorts of
effects. I was wondering if any group has discovered ways and means to
reducing the above described effects.

				Regards,Derek



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From Paul.Jorden at eev.com  Wed Feb 10 15:33:29 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:49 2004
Subject: aluminium coated CCD- end of topic?
Message-ID: <TFSLNIAP@eev.com>

Posted to CCD-world:
-+-+-+-
Jean Marc,

 > This is nice to learn that this already exists and works.
 > Is it a backside thinned chip with an additionnal Al layer on it?
 >
Sure, it was a thin chip.

 > Typical Al thicknesses are 100 nm.
 >
This looks straightforward to deposit.

 > Why do you use an intermediate MgF2 layer? What thickness?
 >
I don't know the thickness offhand.  It would be a thin intermediate layer, 
as a buffer between the Al and Si.

Maybe we've finished covering the general details of this idea now?
If you want to continue discussing more specifically, or want to buy such a 
device in the future, feel free to get in touch.
Otherwise, we'll let the others of ccd-world file the information away...

Cheers,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

-+-+-+-
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From jmdefise at ulg.ac.be  Thu Feb  4 19:18:33 1999
From: jmdefise at ulg.ac.be (Jean-Marc Defise)
Date: Thu Jul 29 11:54:49 2004
Subject: aluminium coated CCD
Message-ID: <01be5062$6496bcd0$ebb2a58b@soho.csl.ulg.ac.be>

Posted to CCD-world:
-+-+-+-
This is nice to learn that this already exists and works.
Is it a backside thinned chip with an additionnal Al layer on it?

Typical Al thicknesses are 100 nm.

Why do you use an intermediate MgF2 layer? What thickness?

Concerning the chip to test, our test facilities are not available for a
while. But I take note of your experience in this field.


Thank you for your support,

Best regards,

Jean Marc Defise





Posted to CCD-world:
-+-+-+-
Jean Marc
(cc: to ccd-world, for information)

EEV have made CCDs with Al on the backside.  These were for the space RGS
x-ray instrument.  The Al layer served a similar purpose (ie blocked longer
wavelengths).
They worked fine.
Would you like a sample chip to test (no promises, but I could look)?
Do you know what thickness you need for the EUV application?
Would a thin intermediate layer of MgF2 be OK?

Cheers,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

-+-+-+-
For information about CCD-world, send email to
owner-CCD-world@cfht.hawaii.edu.


-+-+-+-
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From Paul.Jorden at eev.com  Thu Feb  4 17:14:09 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:49 2004
Subject: aluminium coated CCD
Message-ID: <TFSMVFKK@eev.com>

Posted to CCD-world:
-+-+-+-
Jean Marc
(cc: to ccd-world, for information)

 > EUV applications (17.1 to 30.4 nm) usually require the use of very thin
 > aluminium filters which block all the visible/IR light and wavelengths 
lower
 > than 17,1 nm. These filters are very fragile when used in space 
instruments
 > or vacuum chambers.
 >
 > I was simply wondering if it was possible to put directly an aluminium 
layer
 > on the CCD (usually backside thinned) instead of additional filters in 
the
 > optical beam.
 >
 > I was not thinking about using this material as "transparent" gates for
 > charge collection. It sounds another good idea...
 >
EEV have made CCDs with Al on the backside.  These were for the space RGS 
x-ray instrument.  The Al layer served a similar purpose (ie blocked longer 
wavelengths).
They worked fine.
Would you like a sample chip to test (no promises, but I could look)?
Do you know what thickness you need for the EUV application?
Would a thin intermediate layer of MgF2 be OK?

Cheers,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From Paul.Jorden at eev.com  Thu Feb  4 15:21:09 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:49 2004
Subject: aluminium coated CCD
Message-ID: <TFSLJCOL@eev.com>

Posted to CCD-world:
-+-+-+-
Hi

 > Does anyone know about aluminium coated backside thinned CCD for EUV
 > applications?
 > Are there specific reasons that prevent manufacturers to work on this 
topic?
 > (what about the interface Al-Si?)
>
Would you like to elaborate a bit?
It sounds like you are looking to use Al as a backside gate to allow 
efficient charge collection on the backside (because it is fairly 
transparent in the EUV).  Is this right?
Give a few more details, and I'll enquire about it.
What wavelength region exactly is of interest?
I understand that Al penetrates undesirably into the Si at high 
temperatures; but this could be avoidable.

Regards,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/

-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From jmdefise at ulg.ac.be  Wed Feb  3 17:21:55 1999
From: jmdefise at ulg.ac.be (Jean-Marc Defise)
Date: Thu Jul 29 11:54:49 2004
Subject: aluminium coated CCD
Message-ID: <01be4f88$eed3ff50$ebb2a58b@soho.csl.ulg.ac.be>

Posted to CCD-world:
-+-+-+-
Does anyone know about aluminium coated backside thinned CCD for EUV
applications?
Are there specific reasons that prevent manufacturers to work on this topic?
(what about the interface Al-Si?)

Any input on this would be appreciated.

Best regards,

JM. DEFISE


===========================================
Jean Marc DEFISE
CENTRE SPATIAL DE LIEGE - BELGIUM
www.ulg.ac.be/cslulg
jmdefise@ulg.ac.be
===========================================


-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From tabbott at sparc.not.iac.es  Thu Jan 28 18:51:55 1999
From: tabbott at sparc.not.iac.es (Tim Abbott)
Date: Thu Jul 29 11:54:50 2004
Subject: UCLA short course on "Charge-Coupled Devices and Cameras"
Message-ID: <199901281751.RAA25344@sparc2.not.iac.es>

Posted to CCD-world:
-+-+-+-

I expect that almost everyone knows about these courses, but for those
few that don't, this arrived in my emailbox the other day:

> > On April 19-23, 1999, UCLA Extension will present the short course, 
> > "Charge-Coupled Devices, Cameras, and Applications", on the UCLA 
> > campus in Los Angeles.
> > 
> > The instructors are James R. Janesick, MSEE, PixelVision;
> > Morley Blouke, PhD, Scientific Imaging Technology; and 
> > Terrence Lomheim, PhD, The Aerospace Corporation.
> > 
> > This course is intended for scientists, engineers, and hardware
> > managers involved with CCDs, and reviews the remarkable
> > characteristics of charge-coupled devices (CCDs) used in imaging 
> > camera systems.  The course details advances in pixel count 
> > (arrays as large as 7000 x 9000), quantum efficiency (spectral 
> > coverage of 1 to 11,000 A), charge transfer efficiency (99.9999% 
> > efficient per pixel transfer), read noise (less than 1 e rms), large 
> > dynamic range (greater than 10x6), and high-speed operation 
> > (diffusion limited).  Technologies used to achieve such high levels 
> > of performance are discussed.  The course also reviews the design 
> > of slow-scan and fast-scan CCD imaging cameras.  Applications 
> > include NIR, visible, UV, x-ray, and particle imaging camera systems.
> > 
> > A high-performance CCD camera is demonstrated.
> > 
> > The course should enable you to:
> >  --Become familiar with basic CCD theory and operation of large 
> > pixel arrays
> >  --Understand how CCDs are designed and processed
> >  --Become familiar with process yield, packaging, and cost
> >  --List critical CCD performance characteristics and limitations for
> > state-of-the-art sensors
> >  --Become familiar with new CCD technologies
> >  --Understand color imaging design approaches using CCDs
> >  --Understand constraints of television standards on color CCD 
> > design and utilization
> >  --Apply and explain CCD signal and image processing theory
> >  --Have a sound and practical understanding of how CCDs are
> >   calibrated and characterized for imaging applications
> >  --Specify CCD camera performance parameters with an emphasis 
> > on MTF characteristics
> >  --Design and fabrication of a general purpose CCD camera system
> >  --Define grounding, shielding, and CCD cooling for low noise
> > requirements
> >  --Define camera tests for calibration and optimization
> >  --Understand radiation damage mechanisms and solutions
> >  --Become familiar with absolute units and standards used to specify 
> > CCD and camera performance parameters found by the CCD Transfer 
> > method.
> > 
> > UCLA Extension has presented this highly successful short course 
> > since 1994.
> > 
> > The course fee is $1595, which includes extensive course materials.
> > These materials are for participants only, and are not for sale.
> > 
> > For additional information and a complete course description, please
> > contact Marcus Hennessy at:
> > (310) 825-1047
> > (310) 206-2815  fax
> > mhenness@unex.ucla.edu
> > http://www.unex.ucla.edu/shortcourses/
> > 
> > This course may also be presented on-site at company locations.
> 


-- 
Tim Abbott                                                    tabbott@not.iac.es
Support Astronomer                               http://www.not.iac.es/~tabbott/
                           Nordic Optical Telescope
       Apartado 474 E-38700, Santa Cruz de La Palma, Canary Islands, Spain
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From tabbott at sparc.not.iac.es  Thu Jan 28 18:22:13 1999
From: tabbott at sparc.not.iac.es (Tim Abbott)
Date: Thu Jul 29 11:54:50 2004
Subject: EEV CCDs for sale
Message-ID: <199901281722.RAA24283@sparc2.not.iac.es>

Posted to CCD-world:
-+-+-+-

Because of Microsoft's incompatibility with Unix (so I'm told),
I had to edit Paul's email listing his CCDs for sale.  Unfortunately,
in the process, I appear to have wrecked the key to his table.  It 
should read:

Key: BC =   Black columns measured on flat-field image
     WC =   White columns measured on dark frame
     BS =   Black spots measured on flat field image
     WS =   White spots measured on dark frame

Sorry Paul!

Cheers,

        Tim Abbott
        Moderator, CCD-world.

--
Tim Abbott                                                    tabbott@not.iac.es
Support Astronomer                               http://www.not.iac.es/~tabbott/
                           Nordic Optical Telescope
       Apartado 474 E-38700, Santa Cruz de La Palma, Canary Islands, Spain
-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From Paul.Jorden at eev.com  Thu Jan 28 13:01:03 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:50 2004
Subject: EEV CCDs & WWW pages
Message-ID: <TFSJMDWE@eev.com>

Posted to CCD-world:
-+-+-+-

Hi everyone,

I'm in the process of updating the EEV WWW pages, and hope that more
information will soon be available (including data sheets etc).  Also, 
some more 'latest news'.

In the meantime, you may be interested in the following:-
-------------------------------------------------------------------------------

Surplus devices available from EEV

>From time to time EEV accumulates a stock of special devices that we are
able to offer for sale.

The table below lists a set of CCD42-80 large-format scientific sensors,
which are available at the current time.

They are offered for sale, on a 'first-come-first-served' basis.  There
can be no guarantee of availability, which is subject to prior sale.
We anticipate that other device types will be available in the near future;
watch this space!

The table summarises device data.  Refer to the data sheet for CCD42-80 for
information about these devices, including grading classification.  Note
that grade-3 here indicates that the device just falls outside a grade-2
classification.  Grade-5 (set-up) means that the device functions, but
generally is cosmetically (or electrically) unsuitable for scientific use.

Furthermore, test images and additional data is available on request.
I am looking into making this available on the WWW.  However full-size
unbinned images (18Mb) will be too large to realistically download.
**  I would welcome any suggestions about what sort of minimum information
could be useful?

CCD42-80 Devices Currently Available


Serial #       BC   WC   BS   WS   Grade

7042-20-3      2    4    2297 77   3
7042-9-3       2    4    366  156  1
7043-4-5       2    6    ??  >1000 5
7061-14-5      10   0    267  304  2
7061-17-3      16   0    229  3    3
7061-17-4      14   0    236  32   3
7061-4-3       9    0    336  358  2
7061-8-3       9    0    529  16   2
7461-16-8      15   0    442  7    3
8053-13-7      0    5    353  819  2
8053-16-6      1    10   1958 940  5
8053-16-7      40   33   676  3096 5
8053-6-6       7    1    799  3940 5

Key: BC      WC      BS      WS 
Some devices have not yet been fully packaged (shimmed); this will be done
at time of order.  Devices that have been shimmed are available for shipment
immediately.

Contact me for further information.

Cheers, Paul J.
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/



-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From wmz at ucolick.org  Wed Jan 27 18:01:15 1999
From: wmz at ucolick.org (Mingzhi Wei)
Date: Thu Jul 29 11:54:50 2004
Subject: Question about SITE SI003AB 
In-Reply-To: <01be490c$82180500$9e94e29f@IRCCD.kmb.ac.cn> 
Message-ID: <wmz-990127170115.A0115351@gardiner.ucolick.org>

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From ccd at public.km.yn.cn  Tue Jan 26 18:16:08 1999
From: ccd at public.km.yn.cn (CCD lab)
Date: Thu Jul 29 11:54:50 2004
Subject: Question about SITE SI003AB
Message-ID: <01be490c$82180500$9e94e29f@IRCCD.kmb.ac.cn>

Posted to CCD-world:
-+-+-+-
Dear Sir,
Our PI 1024*1024 TKB CCD(SITe 1024X1024 SI-003A CCD chip) has problem now.
On image, its CTE is very poor. In this camera, a EL7182 is used to drive
the RGd,(d is the output) through a resistor of 191 ohm. We think the RGd is
not clocked properly. The time delay of this pin is about 700 ns, that means
the equivalent capacitor of RGd is about 1300pF! Is there anything wrong
with this pin?

On the other hand, the output of EL7182 is a very good pulse with a width of
600ns and an amplitude of 12V, then it is input into the 191ohm resistor.
After that, the waveform changes into a triangle, with a amplitude of 10.5V
and width of 1500ns. Does this pulse work well?

Thank you.


Jun Xu
ccd@public.km.yn.cn


-+-+-+-
For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From richard at ucolick.org  Fri Jan 22 11:48:46 1999
From: richard at ucolick.org (Richard Stover)
Date: Thu Jul 29 11:54:50 2004
Subject: High resistivity CCDs 
In-Reply-To: <36A73317.92F9854F@routes.com> 
Message-ID: <richard-990122104830.A0327622@gardiner.ucolick.org>

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From richard at ucolick.org  Fri Jan 22 11:27:41 1999
From: richard at ucolick.org (Richard Stover)
Date: Thu Jul 29 11:54:50 2004
Subject: High resistivity CCDs 
In-Reply-To: <199901211447.AA05639@billabong.astr.cwru.edu> 
Message-ID: <richard-990122102725.A0227622@gardiner.ucolick.org>

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From Paul.Jorden at eev.com  Thu Jan 21 17:14:42 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:50 2004
Subject: High resistivity CCDs 
Message-ID: <TFSMVXNU@eev.com>

Posted to CCD-world:
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Richard,

Thanks for your response about the deep depletion CCD.

I wish you luck in finding support for this work. 
Unfortunately, I think EEV would only be in a 
position to take funds (to make such devices), 
rather than to provide funds.


I guess you know that EEV have made n-channel Si 
CCDs before, with ~ 1500  ohm-cm.  These worked
well, primarily for x-ray work.  Most production
involves the normal lower resitivity material, so
it is hard to justify runnning alternate batches,
except for a specific contract.  However, occasionally
devices will get made in this way.  EEV have also 
made some p-channel CCDs (small 02-06 devices) 
that worked well. Larger ones could clearly be
made.  Really it just needs the funding- as does 
the LBL work!

If you ever wanted to explore further the possibility
of getting anything made here, then please get in 
touch.  May I leave you to tell your collaborators
at LBL about our capability?

I'll be interested to hear how you get on with the 
f/1.7 spectrograph tests. 

Good luck,

Regards,
Paul
_______________________________________________________________
Dr Paul Jorden,  CCD Applications, EEV
Waterhouse Lane, Chelmsford, Essex, CM1 2QU, UK
Tel:      44 (0) 1245 -453458 (direct), -493493 (switchboard)
Fax:      44 (0) 1245 453224
see also:-     http://www.ccd.eev.com/



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For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From smithk at routes.com  Thu Jan 21 10:00:55 1999
From: smithk at routes.com (Ken Smith)
Date: Thu Jul 29 11:54:50 2004
Subject: High resistivity CCDs
References: <TFSJSSPE@eev.com>
Message-ID: <36A73317.92F9854F@routes.com>

Posted to CCD-world:
-+-+-+-
Mainly to Dr. Jorden:

Do high resistivity CCDs have any possible slower readout speeds than regular CCDs in general ?  For example, is the parallel clock speed need to be slower to achieve good CTE ?

Are dark currents higher for whatever reason ?  Would the IMO (MPP) apply to these CCDs ?

Would typical pixel sizes need to be much different ?

Finally, is full-well potential different ?


Thanks, Ken Smith
Routes Inc.
303 Legget Drive
Kanata, ON, Canada K2K 2B1
Phone (613) 592-0748


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For information about CCD-world, send email to owner-CCD-world@cfht.hawaii.edu.

From harding at billabong.astr.cwru.edu  Thu Jan 21 10:47:30 1999
From: harding at billabong.astr.cwru.edu (Paul Harding)
Date: Thu Jul 29 11:54:50 2004
Subject: High resistivity CCDs
In-Reply-To: <richard-990120105137.A0218319@gardiner.ucolick.org>
Message-ID: <199901211447.AA05639@billabong.astr.cwru.edu>

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From jb at apo.nmsu.edu  Wed Jan 20 12:00:18 1999
From: jb at apo.nmsu.edu (Jon Brinkmann)
Date: Thu Jul 29 11:54:50 2004
Subject: Coupling fiber optics window on a CCD
Message-ID: <199901201800.LAA14260@galileo.apo.nmsu.edu>

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From richard at ucolick.org  Wed Jan 20 11:51:54 1999
From: richard at ucolick.org (Richard Stover)
Date: Thu Jul 29 11:54:50 2004
Subject: High resistivity CCDs 
Message-ID: <richard-990120105137.A0218319@gardiner.ucolick.org>

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From Paul.Jorden at eev.com  Wed Jan 20 13:16:52 1999
From: Paul.Jorden at eev.com (Paul.Jorden@eev.com)
Date: Thu Jul 29 11:54:50 2004
Subject: High resistivity CCDs
Message-ID: <TFSJSSPE@eev.com>

Posted to CCD-world:
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Hi Richard, and everyone,

I'd like to add to the discussion about deep depletion devices  I'm glad you started it again  Also, your 
web-links to LBL/Lick papers on these devices are very helpful.

>  These devices promise some really spectacular 
performance because they are 300um thick and are 
sensitive throughout that entire volume. This 
means they have superior red response and NO 
FRINGING out to 1000nm

>  Thinning is not required, so the expensive and
difficult thinning processing is eliminated. Holes, 
instead of electons, are the signal carriers so 
special backside treatments to enhance QE aren't
needed. This means they have good blue response too.

Perhaps you should repeat that you are using n-type 
Silicon (cf the p-type material that is normally used
for CCDs).  Of course, high resitivity is also possible
with p-type, although the properties are somewhat different.

>  No design is perfect and even these CCDs have their limitations.  (Some are spelled out in the papers found
 at the home page.)

I recognise the advantages, and would hope that EEV 
could make more such variants in the future.  I would 
be interested in seeing a good summary of the pros 
and cons of these devices- do you know of one?

Of course the high red sensitivity can be invaluable 
for most astronomy applications.  I'm interested in 
trying to gauge the value, and then weigh up the 
merits of the device against the disadvantages, as I 
guess you and others are.  Let's discuss the two 
main applications-

(a) direct imaging.  High