EUV CCD
Peter.Pool at eev.com
Peter.Pool at eev.com
Wed Apr 28 09:04:36 CLT 1999
Posted to CCD-world:
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Hi
Short summary:
1. Thin passivating layer
2. Clean vacuum system (many measurements are degraded by absorption in
adsorbed layers)
Peter Pool
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From: jmdefise at ulg.ac.be
To: ccd-world at cfht.hawaii.edu
Subject: EUV CCD
Date: 27 April 1999 14:42
<<File Attachment: ENVELOPE.TXT>>
Posted to CCD-world:
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Hi CCD-World,
Is it possible to shortly summarize the features (and their resulting
effects) that can be used to improve the EUV sensitivity of CCD's? I mean
for wavelengths ranging from 15 to 40 nm.
Many thanks,
Jean Marc DEFISE
CENTRE SPATIAL DE LIEGE
Avenue du Pre Aily B-4031 Angleur BELGIUM
www.ulg.ac.be/cslulg
jmdefise at ulg.ac.be
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