EUV CCD

Peter.Pool at eev.com Peter.Pool at eev.com
Wed Apr 28 09:04:36 CLT 1999


Posted to CCD-world:
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Hi
     Short summary:

1.  Thin passivating layer
2.  Clean vacuum system (many measurements are degraded by absorption in 
adsorbed layers)

Peter Pool

 ----------
From: jmdefise at ulg.ac.be
To: ccd-world at cfht.hawaii.edu
Subject: EUV CCD
Date: 27 April 1999 14:42

<<File Attachment: ENVELOPE.TXT>>
Posted to CCD-world:
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Hi CCD-World,

Is it possible to shortly summarize the features (and their resulting
effects) that can be used to improve the EUV sensitivity of CCD's? I mean
for wavelengths ranging from 15 to 40 nm.


Many thanks,


Jean Marc DEFISE


CENTRE SPATIAL DE LIEGE
Avenue du Pre Aily B-4031 Angleur BELGIUM
www.ulg.ac.be/cslulg
jmdefise at ulg.ac.be
===========================================

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