CCD-world: Need QE info on SONY ILX511 and ILX526A CCD linear image sensors.

[Don Groom]

The following was posted to CCD-world:


Scott,

I agree with Craig Mackay that you will have to measure the QE yourself,
or go by that of similar devices. But I note

--"Relative sensitivity" for photodectors is often given in
current/incident power. I'm not sure about the curve given in the ILX511
spec sheets, but conversion from current/incident power to relative QE
would raise the value at 700 nm by 1/0.64 relative to 450 nm. I suspect QE
for this device peaks in the red, as you expect.

--The bumps are probably due to interference in the gate layers.

--QE(lambda) is very dependent on the thickness of the active region,
since the absorption length of light in Si changes by more than four
orders of magnitude over the useful optical region, and for most devices
exceeds the active region thickness someplace in the red or IR (see
SPIE 3649, 80-90 (1999) or the web page listed in my signature file).

--In any case, response dies completely as the bangap is approached; this
is at about 1100 nm at 300 K and drops by about 30 nm at 153 K.

--The problem Craig Mackay mentions about MTF increasing with depletion
depth, and hence the need to match pixel size properly, is avoided by
some of us by overdepleting the substrate.  (See Steve Holland's Bruges
paper, about 5 down on our web page list.)

Don
-|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|--|-
Don Groom deg at lbl.gov (Particle Data Group, Supernova Cosmology Project)
http://pdg.lbl.gov/~deg/ccd.html   Voice: 510/486-6788 FAX: 510/486-4799
Analog: 50-6008//Berkeley Lab//Berkeley, CA 94720
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