SHIFT (pixels)
HA DEC x y
0 -30 0. 0.
0 -60 0.7 -0.2
2w -60 0.7 -0.9
4w -30 0.3 -0.9
2w 0 -0.2 -0.4
0 +20 0.3 0.4
2e 0 0.7 1.1
4e -30 1.3 1.6
2e -60 1.9 0.8
0 -60 1.6 0.0
4w -60 1.4 -1.0
4w +15 1.4 -0.4
4e +10 2.0 2.0
4e -60 2.7 1.5
0 -30 1.7 0.6
These tests were made on 7 Oct 1995 using the red long camera (right port), Tek2048#4 (24 micron pixels), 31.6 l/mm echelle and grating 181 cross disperser.
The above measurements are with the instrument rotator in PA 180° (slit E-W). When the spectrograph is rotated (for example, to the parallactic angle) the shifts will be different, but still within the same range.
My strategy with these long exposures is to take arc spectra before and after each exposure at each instrument PA, and then average the two corresponding arc spectra together to get a wavelength calibration for a particular object exposure. Between object exposures, I rotate the instrument to the correct parallactic angle for the middle of the next exposure. Thus, the observing sequence is: