In situ CCD testing.

T. M. C. Abbott

24 May 1995

Abstract:

• How to use this document
• Introduction
  • Introduction: Data Required
  • Introduction: Data reduction
• Bias images
  • Bias images: Data Required
  • Bias images: Reduction Procedure
• The Transfer Curve
  • Transfer curves: Data Required
  • Transfer curve: Reduction Procedure
• Linearity
  • Linearity curves: Data Required
  • Linearity curves: Reduction Procedure
• Low count level flats
  • Low count level flats: data required.
  • Low count level flats: Reduction Procedure
• Darks
  • darks: data required.
  • Darks: Reduction Procedure
• Charge Transfer Efficiency
  • CTE: data required.
  • CTE: Reduction Procedure
• The Shutter Pattern
  • The Shutter Pattern: data required
  • The Shutter Pattern: Reduction Procedure
• Bit Biases
  • Bit Biases: data required
  • Bit Biases: Reduction Procedure
• About this document ...